ISSN:
1600-5767
Source:
Crystallography Journals Online : IUCR Backfile Archive 1948-2001
Topics:
Geosciences
,
Physics
Notes:
Computer simulations have been carried out to test the theory of the origin of the `white-line effect' in diffraction patterns of some mixed charge-transfer salts put forward by Ravy, Pouget & Comés (1992) [J. Phys. I France, 2, 1173–1190]. The diffraction patterns shown confirm that the pinning of charge-density waves to defects is responsible for the effect. The magnitudes of the atomic displacements, which were assumed to be small in development of the theory, are shown to be crucial for the effect to be observed. For displacements of 0̃.008 Å, the phenomena are clearly visible, but for magnitudes of only 0̃.08 Å they become masked by higher-order diffraction effects.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1107/S0021889895004110
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