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  • 1
    Electronic Resource
    Electronic Resource
    On the geometrical conditions for recording X-ray topographs of large crystal slices (1980)
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 13 (1980), S. 1-6 
    Details
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: Geometrical aspects of large-scale transmission X-ray topography with Kα1 radiation have been considered. It is shown that the height of a crystal slice which can be effectively recorded is given as Heff = 2L(Δλ/λ)1/2, where L is the source-to-sample distance and Δλ is the wavelength difference for the Kα doublet. A geometrical scheme termed the moving-slit simulation has been developed to examine the influence of various experimental parameters such as the widths of source and slits, the involved distances and the adjustment of the sample. The usefulness of this scheme is demonstrated experimentally.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0021889880011417
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