Publication Date:
2013-01-29
Description:
Author(s): J. T-Thienprasert, S. Rujirawat, W. Klysubun, J. N. Duenow, T. J. Coutts, S. B. Zhang, D. C. Look, and S. Limpijumnong The synchrotron x-ray absorption near edge structures (XANES) technique was used in conjunction with first-principles calculations to characterize Al-doped ZnO films. Standard characterizations revealed that the amount of carrier concentration and mobility depend on the growth conditions, i.e. H 2 (o... [Phys. Rev. Lett. 110, 055502] Published Mon Jan 28, 2013
Keywords:
Condensed Matter: Structure, etc.
Print ISSN:
0031-9007
Electronic ISSN:
1079-7114
Topics:
Physics
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