Publication Date:
2015-05-06
Description:
Author(s): H. Sawada, T. Sasaki, F. Hosokawa, and K. Suenaga Atomic resolution at a low accelerating voltage with aberration correction is required to reduce the electron irradiation damage in scanning transmission electron microscopy imaging. However, the reduction in resolution caused by the diffraction limit becomes severe with increasing electron waveleng... [Phys. Rev. Lett. 114, 166102] Published Fri Apr 24, 2015
Keywords:
Condensed Matter: Structure, etc.
Print ISSN:
0031-9007
Electronic ISSN:
1079-7114
Topics:
Physics
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