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  • 1
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 81 (2002), S. 1023-1025 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Raman microscopy is used to study the evolution of vibrational modes of vanadium dioxide single crystals and thin films in the vicinity of the phase transition. The results support the electron correlation model of phase transformation. © 2002 American Institute of Physics.
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  • 2
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 74 (1993), S. 7054-7060 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The mirror temperature response of a diode laser to injection current is studied through the photodeflection method. A theoretical model is presented together with some experimental measurements. Theoretical results are compared with experimental measurements for an AlGaAs quantum well laser diode.
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  • 3
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 78 (1995), S. 6321-6323 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Pb(Ti0.48Zr0.52)O3 films produced by pulsed laser ablation deposition have been locally examined for their homogeneity and thickness through a comparative use of Raman and infrared spectroscopy. Raman scattering intensity appears to be an oscillating function of the position of the point under measurements. The observed oscillations were explained by light interference effects in the film and used to obtain the thickness profile and the refractive index dispersion of the film. The intensity distribution in Raman spectra across the film differs from that of the target. This difference is larger at the center than near the edge of the film. © 1995 American Institute of Physics.
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  • 4
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 74 (1993), S. 2535-2542 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We present the application of spectroscopic phase modulated ellipsometry to the study of both ultrafast and slow processes of the interaction of silane (SiH4) with thin films of palladium. Changes of the optical properties of thin films exposed to different SiH4 fluxes are monitored by in situ single wavelength ellipsometry in the case of high fluxes which lead to ultrafast processes and by in situ spectroscopic ellipsometry at low fluxes and slow kinetics. The study of the interaction of SiH4 with Pd at 250 °C reveals the complicated character of the process which depends on the flux of silane and leads to the formation of palladium disilicide, palladium hydrides, and an intrinsic porosity. A qualitative model of the process is proposed. The initial stage of the reaction at high fluxes of SiH4 is dominated by a grain boundary diffusion of SiH4 inside the Pd film, followed by the catalytic decomposition of SiH4 and a strong process of an intrinsic formation of porosity. This fast process (duration of 10 ms) proceeds through the formation of a metastable Pd-rich phase. The appearance of the intrinsic porosity enhances the diffusion of SiH4 inside the Pd film, which results in a drastic acceleration of the silicide formation. At low SiH4 fluxes the characteristic time of the reaction increases up to some tens of minutes and proceeds through the formation of both silicide and palladium hydride.
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  • 5
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 76 (2000), S. 1107-1109 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: It is demonstrated here that nonresonant Raman spectroscopy can be used for unequivocal determination of short-range order in ultrathin films, using different structures of titanium dioxide as the model system. Titania films as thin as 7 nm sputter deposited on 〈111〉 Si have been analyzed and their phase content determined. © 2000 American Institute of Physics.
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  • 6
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 76 (2000), S. 2050-2052 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We report laser-induced phase transitions in CdS nanocrystals under radiation of 7 ns laser pulses with a wavelength of 532 nm. The observed change in size distribution of the nanocrystals, as well as the change of their crystal structure from orthorombic to cubic, are uncovered by high-resolution transmission electron microscopy and selected area transmission electron diffraction. © 2000 American Institute of Physics.
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  • 7
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 78 (2001), S. 3298-3300 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We study the effect of wavelength on the laser-induced phase transformation in semiconductor quantum dots. In our earlier report [Yakovlev et al., Appl. Phys. Lett. 76, 2050 (2000)], we discovered that a nanosecond pulse of 532 nm radiation results in a phase transformation of CdS nanocrystals from an orthorhombic to cubic phase. In this study, we find that irradiation with the pulse of a different wavelength (355 nm) results in a completely different transformation to a hexagonal wurtzite phase and a significant broadening of nanocrystal size distribution. The nanocrystal stoichiometry remained unchanged by the laser irradiation, as verified by energy dispersive x-ray spectroscopy. © 2001 American Institute of Physics.
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  • 8
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 75 (1999), S. 1830-1832 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We have measured an enhancement factor of Raman signal up to 30 times using a Fabry-Pérot structure made of porous silicon (PS) layers of different porosity. The obtained enhancement was due to the coupling of the laser radiation and Stokes photons of porous silicon with the microcavity mode at the optimal laser beam incidence and scattering angles. Our results provide a way to increase the sensitivity of Raman spectroscopy for studying the species inside porous silicon which can considerably influence the properties of this material and hence of PS based devices. © 1999 American Institute of Physics.
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  • 9
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 79 (2001), S. 4136-4138 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: A nonlinear optical technique based on a third-harmonic generation of a circular polarized light is proposed for the diagnostics of order–disorder transformations in semiconductors. Applications of this technique to study both noncentrosymmetric (GaAs) and centrosymmetric (Si) materials are demonstrated. © 2001 American Institute of Physics.
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  • 10
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 62 (1993), S. 1818-1820 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We report a novel method for growth and fabrication of high performance strained InGaAs/AlGaAs quantum-well buried-heterostructure (BH) lasers. The method involves growth of the laser structure by molecular beam epitaxy, mesa formation by in situ melt etching using SiO2 stripes as a mask, and regrowth of p−-p-n AlGaAs isolating layers by liquid phase epitaxy. The method allows etching, preservation of high quality sidewalls, regrowth, and planarization in one step with negligible thermal disordering. Compared to ridge waveguide lasers, the BH lasers so fabricated have significantly lower threshold current, higher power output, higher temperature operation, lower cavity losses, and kink-free light-current (L-I) characteristics, as expected. A cw power of 150 mW/facet at 986 nm was measured from a 400-μm-long BH laser with 11 μm active stripe width. A minimum threshold current of 2.5 mA was measured for lasers with 3.0 μm active width and 300–400 μm cavity length. The L-I characteristics of 500-, 800-, and 1300-μm-long lasers with 3.0 μm active width were linear up to the currents corresponding to a current density of 10 kA cm−2. At higher current densities, a sublinear increase of power with current was observed. Stable fundamental transverse mode operation was obtained up to 100 mW emitted power.
    Type of Medium: Electronic Resource
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