Electronic Resource
Woodbury, NY
:
American Institute of Physics (AIP)
Applied Physics Letters
58 (1991), S. 2144-2146
ISSN:
1077-3118
Source:
AIP Digital Archive
Topics:
Physics
Notes:
Two new electron paramagnetic resonance centers are reported, Si-L8 and Si-L9, which are identified with the stable and one of the four metastable configurations, respectively, of a multistable defect recently discovered by deep level transient capacitance spectroscopy in electron-irradiated phosphorus-doped silicon. Resolved 31P hyperfine interactions and stress-induced alignment effects are detected in the spectra which serve to confirm the identification as a Ci-Ps pair and lead to a model for the atomic structure in the stable configuration.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.104987
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