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  • 1
    Electronic Resource
    Electronic Resource
    High speed characteristics of thin film write heads at deep submicron track width (2000)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 87 (2000), S. 5416-5418 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: This article presents a micromagnetic study of the dynamic magnetic switching process in the pole tip region of stitched-pole thin film write heads. The impacts of track width reduction and pole material saturation moment on the high frequency performance of the heads have been investigated. It is found that the magnetic switching process of the pole tip region at low recording frequencies can be characterized by three stages: the nucleation of a vortex (or vortices), followed by the motion of the vortex (or vortices), and finally the annihilation of the vortex (or vortices). At high frequencies, however, a residual vortex (or vortices) will always remain in the pole tips, resulting in lower head field amplitude. Frequency roll-off characteristics of the head field response have been calculated. The roll off is the result of residual vortex (or vortices), and the vortex moving speed limits the operational frequency range of the head. Reducing the track width lowers the head field 3 dB roll-off frequency. The simulation also finds that the use of 45/55 NiFe, which has significantly higher moment than permalloy, results in higher roll-off frequency as compared to permalloy. © 2000 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.373361
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  • 2
    Electronic Resource
    Electronic Resource
    Barium ferrite thin film media with perpendicular c-axis orientation and small grain size (2000)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 87 (2000), S. 6370-6372 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Barium ferrite thin films with perpendicular c-axis orientation and small grain size (about 300 Å) were successfully fabricated with careful control of sputtering conditions. The c-axis orientation of barium ferrite thin films is most sensitive to the oxygen partial pressure during deposition. All samples with oxygen gas during deposition have a random c-axis texture, as indicated by existence of both weak (00l) peaks and (106) peaks. All the samples without oxygen gas during deposition show only strong (00l) peaks, which indicate excellent perpendicular c-axis orientation. Transmission electron microscopy results show that oxygen gas promotes the growth of in-plane and/or randomly oriented grains. The effect of the Pt interlayer on the barium-rich films was also studied. The Pt interlayer was found to be very effective in improving c-axis orientation of barium-rich films. A relative increase in perpendicular nucleation sites over in-plane and/or random nucleation sites contributes to the improvement in perpendicular c-axis orientation. © 2000 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.372709
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  • 3
    Electronic Resource
    Electronic Resource
    Exchange coupling of NiFe/CrMnPtx bilayers prepared by a substrate bias sputtering method (2000)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 87 (2000), S. 410-415 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We have investigated the unidirectional exchange anisotropy between a ferromagnetic Ni81Fe19 film and a disordered antiferromagnetic CrMnPtx (x=3, 6, or 9) film prepared by substrate bias sputtering. A hysteresis loop with the shape predicted by the planar domain-wall model was found in the sample without substrate bias, suggesting that the interfacial exchange coupling energy between the Ni81Fe19 and CrMnPtx layers is comparable to the antiferromagnetic domain-wall energy. The substrate bias on the Ni81Fe19 underlayers improved the texture of the CrMnPtx layers but also increased the interface roughness. The substrate bias effect on the exchange bias can be understood in terms of the planar domain-wall model. The interface roughness reduces the interfacial exchange coupling by introducing defects and disordering the antiferromagnetic moments at the interface. This leads to a triangular hysteresis loop. The texture improvement increases the exchange bias by increasing the domain-wall energy of the antiferromagnet. The differences between these substrate bias effects and those observed in the Ni81Fe19/Fe50Mn50 bilayer system are also discussed. © 2000 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.371876
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  • 4
    Electronic Resource
    Electronic Resource
    Angular dependence of exchange anisotropy in Ni81Fe19/CrMnPtx bilayers (1999)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 86 (1999), S. 5169-5174 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We have investigated the unidirectional exchange anisotropy between a ferromagnetic (FM) Ni81Fe19 film and a disordered antiferromagnetic (AF) CrMnPtx (x=3, 6, or 9) film. The angular dependence of the exchange coupling in these FM/AF bilayers has been measured. We show that the complex angular dependence of this exchange coupling can be understood by a simple Stoner–Wohlfarth model involving only a uniaxial anisotropy and a unidirectional exchange coupling. Numerical results are in excellent agreement with the experimental data. © 1999 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.371495
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  • 5
    Electronic Resource
    Electronic Resource
    Effect of damping constant on the switching limit of a thin-film recording head (1999)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 85 (1999), S. 5870-5872 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: This article presents a micromagnetic study on the dynamics of magnetic flux transfer in the pole tip region of a stitched-pole magnetoresistance/thin-film head. Three-dimensional vortices are found inside the pole tips. The flux at the ABS surface is conducted by the motion of the vortex moving in the cross-track direction. The resulting head field well follows the driving flux with little phase delay and little dependence on the damping constant, α. The vortex motion under the driving flux maintains similar speed even when the damping constant is decreased to zero. In this case, it is found that in addition to the motion of the vortex, spins precess locally with small cone angles, resulting in small head field fluctuations. It is concluded that the speed of magnetization flux reversal in the pole tip region is not limited by small damping constant. © 1999 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.369944
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  • 6
    Electronic Resource
    Electronic Resource
    Exchange biasing in sputtered NiFe/PtMn bilayers (2000)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 87 (2000), S. 4918-4920 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The exchange coupling between ferromagnetic Ni81Fe19 and antiferromagnetic (AF) PtxMn1−x films prepared by rf and dc magnetron sputtering has been investigated. The Pt content in the PtxMn1−x film is in the range of 0 at. %〈x〈20 at. %. The exchange field and coercivity were found to depend strongly on the deposition conditions and the AF film composition. X-ray diffraction measurements and transmission electron microscopy measurement showed a γ-PtMn phase with a disordered fcc structure when the PtxMn1−x was deposited on top of the Ni81Fe19 layer. The exchange bias was found to depend on the texture and film composition of the γ-PtMn layers. © 2000 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.373202
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  • 7
    Electronic Resource
    Electronic Resource
    Measurement dependence of the exchange bias (2000)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 87 (2000), S. 4960-4962 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Recently, in addition to the conventional hysteresis loop measurement, several different measurement techniques, such as ac susceptibility, ferromagnetic resonance (FMR), and Brillouin light scattering, have been used to study the unidirectional exchange coupling induced in a ferromagnetic film in proximity to an antiferromagnet. In this article, we theoretically investigate how interface exchange coupling manifests itself in different measurements. The magnetic degrees of freedom of the antiferromagnet are incorporated in this analysis. Anisotropies from hysteresis loop measurements, ac susceptibility measurements, and FMR measurements are obtained. These results show that the measured exchange anisotropies differ with measurement techniques. © 2000 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.373215
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  • 8
    Electronic Resource
    Electronic Resource
    Ferromagnetic resonance studies of exchange biasing in Ni81Fe19/Pt10Mn90 bilayers (2000)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 87 (2000), S. 4367-4374 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: In-plane ferromagnetic resonance (FMR) has been used to study exchange anisotropy in Ni81Fe19/Pt10Mn90 bilayers at room temperature. A theoretical calculation for the FMR resonance field was carried out based on a simple model of the exchange bias in a polycrystalline bilayer that incorporates reversible as well as irreversible behavior of the antiferromagnetic layer. In addition to the expected cos cursive-phiH contribution to the resonance field, where cursive-phiH is the direction of the applied field, there is a negative shift of the resonance field. It is argued that the negative shift of the resonance related to the irreversible behavior of the antiferromagnetic moments is not isotropic. The linewidth broadening of in-plane resonance for the exchange biased bilayers is also discussed. © 2000 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.373080
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  • 9
    Electronic Resource
    Electronic Resource
    Study of the angular-dependent exchange coupling between a ferromagnetic and an antiferromagnetic layer (1999)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 74 (1999), S. 2687-2689 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The angular dependence of the exchange coupling between a Permalloy film and an antiferromagnetic Cr45.5Mn45.5Pt9 film has been measured. We show that this complex angular dependence of the exchange coupling can be understood by a simple Stoner–Wohlfarth model involving only a uniaxial anisotropy and a unidirectional exchange coupling at the interface. Numerical results are in excellent agreement with the experimental data. © 1999 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.123937
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