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  • 1
    Electronic Resource
    Electronic Resource
    Femtosecond time-resolved photoelectron imaging on ultrafast electronic dephasing in an isolated molecule (1999)
    College Park, Md. : American Institute of Physics (AIP)
    The Journal of Chemical Physics 111 (1999), S. 4859-4861 
    Details
    ISSN: 1089-7690
    Source: AIP Digital Archive
    Topics: Physics , Chemistry and Pharmacology
    Notes: Ultrafast dephasing in an intermediate case of molecular radiationless transition has been visualized for the first time by femtosecond time-resolved photoelectron imaging. The decay of photoexcited S1(n,π*) state of pyrazine in 100 ps and the corresponding build-up of triplet states were clearly observed. © 1999 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.479822
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  • 2
    Electronic Resource
    Electronic Resource
    Image storage based on biphotonic holography in azo/polymer system (1998)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 72 (1998), S. 418-420 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Image storage has been investigated with the biphotonic holographic method in an azo/polymer film. Experimental results show that this biphotonic holographic storage has high spatial resolution and exhibits an image enhancement effect after blocking the noncoherent light. The mechanism of biphotonic holographic storage is attributed to the redistribution of cis form azo molecules induced by both coherent light and noncoherent light. © 1998 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.120776
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  • 3
    Electronic Resource
    Electronic Resource
    Resolution limits from charge transport in optically addressed spatial light modulators (1995)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 78 (1995), S. 6923-6935 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Spatial resolution of optically addressed spatial light modulators (OASLMs) is degraded by several different transfer processes in these devices. We have developed a general transient charge transport model to calculate and simulate the resolution limits of OASLMs due to the following charge spreading mechanisms during the transfer process in which the input image is converted into a particular charge distribution in the photosensor layer. (i) The effect of charge drift in the photosensor bulk on resolution increases with the thickness of the photosensor and the light-modulating layers. It also increases with the total amount of photogenerated charge collected at the interface. (ii) The effect of charge diffusion in the photosensor bulk on resolution is largely independent of the carrier mobility in the semiconductor photosensor. In most cases the corresponding spatial frequency f50% is proportional to (square root of)Vsc/dsc, where dsc is the photosensor thickness and Vsc is the voltage drop in that layer. To have high-sensitivity OASLMs the transit time of charge carriers from the photosensor bulk to the interface must be much shorter than the recombination lifetime. (iii) The effects that charge drift, diffusion, and trapping at the photosensor-light-modulating layer interface have on resolution depend strongly on the interface properties. Decreasing the mobility or the trapping time of charge carriers at the interface can dramatically improve the resolution of OASLMs. The resolution ranges from 3 to 875 line pairs/mm for respective diffusion lengths of 10 to 0.1 μm at the interface. The combined effect on resolution from each of the charge spreading and other resolution-degrading mechanisms is also discussed. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.360459
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  • 4
    Electronic Resource
    Electronic Resource
    Surface damage of polymethylmethacrylate plates by ice and nylon ball impacts (1995)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 78 (1995), S. 1643-1649 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: A study is described of the impact process and the corresponding surface damage to PMMA (polymethylmethacrylate) targets impacted by ice and nylon spheres. A gas gun system was used to project the spheres and the impacts were recorded using a high-speed image converter camera (Imacon 792). Special attention was paid to the conditions causing projectile failure and the surface damage to the target. The experimental results show that although the deformation and failure modes for ice and nylon are different, the surface damage to the PMMA target has a similar failure pattern, i.e., a central, circular undamaged region surrounded by an annular damaged region containing many short circumferential cracks. Analysis shows that the diameter d of the central undamaged region and the annular damaged area Am can be used to characterize the surface damage which depends on the projectile material, sphere radius R, as well as the impact velocity V0. For a given projectile, two critical impact velocities exist: One is the threshold velocity (V0)th, below which no visible surface damage is observed, and another is the fracture velocity (V0)f, above which a plate target is broken. Damage in the annular region is caused by the Rayleigh surface wave in the present experiments. The conditions for the Rayleigh surface wave to pass ahead of the expanding edge contact velocity are analyzed. Comparisons between the theoretical predictions and experimental results, including the present study and earlier data, are made for PMMA plates impacted by projectiles of different materials (ice, nylon spheres, and water drops) and at different impact angles. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.360259
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  • 5
    Electronic Resource
    Electronic Resource
    Direct measurement of refractive-index dispersion using a time-delayed technique (1998)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 69 (1998), S. 1472-1475 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: We describe a new way to measure the refractive index of dielectric materials using a time-resolved correlation method. By measuring the time delay of femtosecond pulse trains through a dielectric material, we obtain the refractive index of the material. This technique is direct, less surface sensitive, and precise to four digits. Consequently, it gives a true bulk index value. We apply this technique to measure the refractive index of fused silica, InP, and GaAs in the near infrared spectral regime. © 1998 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1148794
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  • 6
    Electronic Resource
    Electronic Resource
    A small-area high-Tc superconducting bolometer with Y-Ba-Cu-O thin film (1994)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 65 (1994), S. 93-96 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: A small-area high-Tc superconducting bolometer with a dense YBCO meander wire on a (100) Zr(Y)O2 substrate has been tested at λ=1.5 μm using a diode laser as the radiation source. The infrared power absorbed by the bolometer was calibrated using a dc infrared substitution method. Responsivities of hundreds of V/W with a millisecond response time were obtained at a temperature of 86.5 K in the modulation frequency range of 10–3000 Hz. A minimum noise equivalent power of 6×10−11 W/Hz1/2 was measured at 1000 Hz. The experimental results are compared with those obtained from a thermal analysis of the substrate-supported microbolometer. No nonbolometric effect was distinguished.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1144754
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  • 7
    Electronic Resource
    Electronic Resource
    Optimized compact secondary electron collector with 100% collection efficiency for focused ion beam systems (1998)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 69 (1998), S. 91-94 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: This article describes the optimization procedure to design a compact scintillator which has a maximum secondary electron collection efficiency without the need of a bias voltage for a focused ion beam (FIB) system. The optimized scintillator design was proven to be very effective for focused ion beam systems. By doing design optimization theoretically and experimentally, a 100% collection was realized for a simple, compact and robust scintillator structure without the bias voltage. So far our experimental study is within the scope of FIB imaging, but we have reasons to believe that the optimized designs or the optimization methodology discussed in this article should be useful in other charged particle applications such as scanning electron microscopy or wherever a scintillator is used to collect secondary electrons. © 1998 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1148483
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  • 8
    Electronic Resource
    Electronic Resource
    Slip sliding away: A novel head–disk interface and its tribology (invited) (2000)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 87 (2000), S. 5383-5388 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The continuous reduction of head–disk spacing has made the use of supersmooth media a necessity in gaining ultrahigh magnetic recording areal density. To overcome the stiction barrier associated with supersmooth disks without compromising the head flyability requirement, texture features can be transferred from the disk surface to the slider surface, creating a new type of head–disk interface, the padded slider interface. The tribology of a padded slider interface is in many ways different from that of the traditional head–disk interface with texture on the disk only. In this article, various unique tribological aspects of the padded slider interface are discussed in detail. Both theoretical modeling results and experimental data are presented to elucidate the stiction, friction, and wear behaviors of this novel head–disk interface. It is shown that the padded slider technology offers a viable alternative to the ramp load technology as a head–disk interface solution for the ultrahigh areal density. © 2000 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.373352
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  • 9
    Electronic Resource
    Electronic Resource
    A study of dynamic friction at the head–disk interface (2000)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 87 (2000), S. 6152-6154 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: With its precisely controlled contact geometry, the head–disk interface with laser zone texture affords a model system for the study of dynamic friction. By using two types of head sliders, i.e., the conventional slider and the padded slider, and a matrix of hard disks with a wide range of laser zone texture parameters, head–disk contacts involving a small number as well as a large number of bumps are realized. A rich variety of dynamic friction behavior is observed with respect to bump height and bump density dependence. A satisfactory explanation of these friction behaviors requires that both the deformational component and the adhesive component of friction be considered on equal footings. © 2000 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.372639
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  • 10
    Electronic Resource
    Electronic Resource
    Probing nanodefects in fused silica by near-field scanning optical microscopy (1998)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 84 (1998), S. 3016-3019 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Nanodefects were artificially introduced into a fused silica surface by nanoindenting with a commercial atomic force microscope. The sample was illuminated in a total internal reflection configuration and evanescent waves were detected by a near-field scanning optical probe in the constant tip-sample separation mode. The observed contrast in optical images was attributed to the strain fields associated with the nanoindents. Thus the optical image directly maps out the strain distributions associated with these nanoindents. Optical images were taken at different polarizations of the incident light (s and p). Due to different field distributions near the sample surface for the two polarizations, strain distributions at different depths were probed. The spatial resolution of this technique was limited by the probe aperture size and detector sensitivity. This technique may be a useful tool to study laser-induced damage mechanisms in optical materials at the submicron scale.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.368454
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