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  • 1
    Electronic Resource
    Electronic Resource
    "Detector walk" in position-sensitive detectors with biased microchannel plates (2000)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 71 (2000), S. 3758-3761 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: The spatial resolution of high-accuracy microchannel plate (MCP) detectors has reached the values, where the so-called detector walk (or image blurring) may start to limit any further improvements. Image blurring with gain is studied in detail for detectors incorporating angular-biased MCPs. It was found that the presence of the pore bias at the output MCP results in a variation of the charge footprint position for events with different gains. Events with higher gains are shifted in the direction of the pore bias and the absolute value of this shift is directly proportional to the absolute value of the detector gain. Variation of the detector modal gain from 7.5×106 to 2.5×107 resulted in a ∼100 μm image offset for a 13°-biased MCP positioned at a distance of 8.5 mm from the anode with an accelerating rear field of 75 V/mm. We also extended our previous study of another type of detector walk associated with fluctuations of the accelerating rear field. Image displacements as functions of the rear accelerating field for both 13°- and 19°-biased MCPs were measured and compared with the results of computer simulation based on our charge cloud propagation model presented earlier. A good agreement between the experimental and simulated data verifies the validity of the model for different MCPs. © 2000 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1311971
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    Paper (German National Licenses)
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  • 2
    Electronic Resource
    Electronic Resource
    Spatial distribution of electron cloud footprints from microchannel plates: Measurements and modeling (1999)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 70 (1999), S. 3282-3288 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: The measurements of the electron cloud footprints produced by a stack of microchannel plates (MCPs) as a function of gain, MCP-to-readout distance and accelerating electric field are presented. To investigate the charge footprint variation, we introduce a ballistic model of the charge cloud propagation based on the energy and angular distribution at the MCP output. We also simulate the Coulomb repulsion in the electron cloud, which is likely to cause the experimentally observed increase in the cloud size with increasing MCP gain. Calculation results for both models are compared to the charge footprint sizes measured both in our experiments with high rear-field values (∼200–900 V/mm) and in the experiments of Edgar et al. [Rev. Sci. Instrum. 60, 3673 (1989)] (accelerating electric field ∼30–130 V/mm). © 1999 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1149905
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  • 3
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    Wavelength-independent constant period spin-echo modulated small angle neutron scattering (2016)
    American Institute of Physics (AIP)
    Details
    Publication Date: 2016-06-28
    Description: Spin-Echo Modulated Small Angle Neutron Scattering (SEMSANS) in Time-of-Flight (ToF) mode has been shown to be a promising technique for measuring (very) small angle neutron scattering (SANS) signals and performing quantitative Dark-Field Imaging (DFI), i.e., SANS with 2D spatial resolution. However, the wavelength dependence of the modulation period in the ToF spin-echo mode has so far limited the useful modulation periods to those resolvable with the limited spatial resolution of the detectors available. Here we present our results of an approach to keep the period of the induced modulation constant for the wavelengths utilised in ToF. This is achieved by ramping the magnetic fields in the coils responsible for creating the spatially modulated beam in synchronisation with the neutron pulse, thus keeping the modulation period constant for all wavelengths. Such a setup enables the decoupling of the spatial detector resolution from the resolution of the modulation period by the use of slits or gratings in analogy to the approach in grating-based neutron DFI.
    Print ISSN: 0034-6748
    Electronic ISSN: 1089-7623
    Topics: Electrical Engineering, Measurement and Control Technology , Physics
    Published by American Institute of Physics (AIP)
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  • 4
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    Flexible sample environment for high resolution neutron imaging at high temperatures in controlled atmosphere (2015)
    American Institute of Physics (AIP)
    Details
    Publication Date: 2015-12-18
    Description: High material penetration by neutrons allows for experiments using sophisticated sample environments providing complex conditions. Thus, neutron imaging holds potential for performing in situ nondestructive measurements on large samples or even full technological systems, which are not possible with any other technique. This paper presents a new sample environment for in situ high resolution neutron imaging experiments at temperatures from room temperature up to 1100 °C and/or using controllable flow of reactive atmospheres. The design also offers the possibility to directly combine imaging with diffraction measurements. Design, special features, and specification of the furnace are described. In addition, examples of experiments successfully performed at various neutron facilities with the furnace, as well as examples of possible applications are presented. This covers a broad field of research from fundamental to technological investigations of various types of materials and components.
    Print ISSN: 0034-6748
    Electronic ISSN: 1089-7623
    Topics: Electrical Engineering, Measurement and Control Technology , Physics
    Published by American Institute of Physics (AIP)
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