ALBERT

All Library Books, journals and Electronic Records Telegrafenberg

X
feed icon rss

Your email was sent successfully. Check your inbox.

An error occurred while sending the email. Please try again.

Proceed reservation?

Export
Filter
  • American Institute of Physics (AIP)  (5)
  • 1
    Electronic Resource
    Electronic Resource
    Imaging InGaAsP quantum-well lasers using near-field scanning optical microscopy (1994)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 76 (1994), S. 7720-7725 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The application of near-field scanning optical microscopy (NSOM) to the characterization of InGaAsP multiquantum-well lasers is reported. Collection mode images are collected at varying drive currents from well below to well above the threshold current. The high resolution of NSOM (∼λ/20) provides a detailed mapping of the laser output from the active region as well as additional output from the surrounding mesa. Spectral analysis of the image shows that the extra emission is due to InP electroluminescence. In addition to the emission characteristics of the laser it is also possible to detect local heating of the laser facet via thermal expansion. Topographical images are achieved simultaneously with NSOM images by digitizing the feedback signal which maintains a constant tip-surface gap. It is shown that these data have direct implications on device performance and problems associated with carrier leakage and nonradiative defects. © 1994 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.357946
    Location Call Number Expected Availability
    BibTip Others were also interested in ...
    Paper (German National Licenses)
    Fulltext
  • 2
    Electronic Resource
    Electronic Resource
    High density near-field optical recording (invited) (abstract) : 37th Annual conference on magnetism and magnetic materials (1993)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 73 (1993), S. 5791-5791 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Near-field scanning optical microscopy (NSOM) has been used to image and record domains in thin-film magneto-optic (MO) materials (e.g., a Co/Pt multilayer). In this technique, a subwavelength-sized source or detector of visible light is placed in close proximity to a sample and raster scanned to read or write data on a scale inaccessible to traditional lens based systems. The technique, therefore, represents a hybridization of conventional magnetic and MO storage technologies. In the imaging mode, resolution of 30–50 nm has been consistently obtained, whereas in the recording mode, domains down to −60 nm have been written reproducibly. Data densities of −45 Gbits/in.2 have been achieved, well in excess of current magnetic and MO methods. A brief analysis of speed and other issues indicates that the technique may represent a viable alternative to these and other methods for anticipated high density data storage needs.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.353574
    Location Call Number Expected Availability
    BibTip Others were also interested in ...
    Paper (German National Licenses)
    Fulltext
  • 3
    Electronic Resource
    Electronic Resource
    Image contrast in near-field optics (1992)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 71 (1992), S. 4659-4663 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The resolution of optical microscopy can be extended beyond the diffraction limit by placing a source or detector of visible light having dimensions much smaller than the wavelength, λ, in the near-field of the sample (〈λ/10). This technique, near-field scanning optical microscopy, is sensitive to a variety of important sample properties including optical density, refractive index, luminescence, and birefringence. Although image contrast based on certain sample characteristics is similar to that observed in traditional optical microscopy, strong coupling between the probe and sample often produces contrast unique to the near-field.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.350655
    Location Call Number Expected Availability
    BibTip Others were also interested in ...
    Paper (German National Licenses)
    Fulltext
  • 4
    Electronic Resource
    Electronic Resource
    Near-field magneto-optics and high density data storage (1992)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 61 (1992), S. 142-144 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Near-field scanning optical microscopy (NSOM) has been used to image and record domains in thin-film magneto-optic (MO) materials. In the imaging mode, resolution of 30–50 nm has been consistently obtained, whereas in the recording mode, domains down to ∼60 nm have been written reproducibly. Data densities of ∼45 Gbits/in.2 have been achieved, well in excess of current magnetic or MO technologies. A brief analysis of speed and other issues indicates that the technique may represent a viable alternative to these and other methods for anticipated high density data storage needs.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.108198
    Location Call Number Expected Availability
    BibTip Others were also interested in ...
    Paper (German National Licenses)
    Fulltext
  • 5
    Electronic Resource
    Electronic Resource
    Near-field photoconductivity: Application to carrier transport in InGaAsP quantum well lasers (1994)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 65 (1994), S. 2654-2656 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: A new contrast method in near-field scanning optical microscopy in which the near-field probe is used to excite photocurrent in a semiconductor sample is described and demonstrated. The use of near-field optics results in an order-of-magnitude improvement in spot size and a fivefold improvement in resolution over previous methods of photocurrent imaging. The application of this near-field photoconductivity technique to a multiquantum well laser provides direct visualization of carrier transport throughout the structure, yielding information on growth inhomogeneities, carrier leakage and isolation, and the overall quality of p-n junctions. © 1994 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.112593
    Location Call Number Expected Availability
    BibTip Others were also interested in ...
    Paper (German National Licenses)
    Fulltext
Close ⊗
This website uses cookies and the analysis tool Matomo. More information can be found here...