ALBERT

All Library Books, journals and Electronic Records Telegrafenberg

feed icon rss

Your email was sent successfully. Check your inbox.

An error occurred while sending the email. Please try again.

Proceed reservation?

Export
Filter
  • American Institute of Physics (AIP)  (2)
Collection
Publisher
Years
  • 1
    Electronic Resource
    Electronic Resource
    College Park, Md. : American Institute of Physics (AIP)
    The Journal of Chemical Physics 95 (1991), S. 3841-3842 
    ISSN: 1089-7690
    Source: AIP Digital Archive
    Topics: Physics , Chemistry and Pharmacology
    Notes: In a crossed beam experiment we have investigated the influence of the collision geometry on the (in plane) flux of products for the reaction Li+HF(v=1, j=1, m=0)→LiF+H. The spatial alignment of the molecular axes was achieved by applying the infrared radiation pumping technique in a strong electric field. Two geometries have been selected; they feature alignments where the axes stand either preferentially perpendicular to the relative velocity of the approaching reagents (V) and the scattering plane, or lie parallel to V. We find at a scattering angle in the center-of-mass frame of roughly 115° that for the parallel geometry (end-on attacks) a factor of 2.2 more LiF molecules are detected than for the perpendicular one (side-on attacks). This huge steric effect is well recovered by a trajectory calculation based on the ab initio potential energy surface (PES) of Chen and Schaefer. The main reason for the magnitude of the effect is that the products separate along the molecular axis and thus vanish to a large extent from the scattering plane when the molecules stand perpendicular to it.
    Type of Medium: Electronic Resource
    Location Call Number Expected Availability
    BibTip Others were also interested in ...
  • 2
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 80 (1996), S. 4928-4933 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Surfaces of fluoride crystals, fractured by a single excimer laser pulse and then covered by a thin conductive layer, are imaged by scanning electron microscopy in the low-voltage secondary electron mode. As a result of charging, at lower primary electron energies a contrast enhancement can be obtained for surface fragments that are no longer tightly attached to the crystal. This differs from high-energy ((approximately-greater-than)10 keV) imaging which only yields topographic contrasts and allows the analysis of the fractured structure by edge and shadowing effects. Even contrast inversion from positive to negative charging of an entire fragment can be achieved, depending on the primary electron energy. It is shown that this effect can be utilized to discriminate between fragments with a good mechanical contact to the bulk and partially detached ones by systematically studying the contrast as a function of electron energy and specimen inclination. © 1996 American Institute of Physics.
    Type of Medium: Electronic Resource
    Location Call Number Expected Availability
    BibTip Others were also interested in ...
Close ⊗
This website uses cookies and the analysis tool Matomo. More information can be found here...