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  • American Institute of Physics (AIP)  (1)
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    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 61 (1990), S. 3372-3377 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: We have developed a real-time charged particle beam probe which can be used both as a beam diagnostic (beam tuning) and to quantitatively determine the three-dimensional density distribution of a beam. The probe consists of a microchannel plate, an aluminized phosphor screen deposited on a fiber-optic faceplate, a flexible fiber-optic bundle, and a charge injection device (CID) in tandem. Digital or analog video output of the CID is fed into a computer or oscilloscope, respectively, for analysis or observation. The probe can be moved continuously along the beams' paths to obtain "pictures'' of the beam at any desired interval thus giving three- dimensional form factors. Either beam singly or both beams simultaneously may be observed on the monitor facilitating the task of beam adjustment for optimum overlap. The digital output is used for quantitative computation of the beam overlaps. The device is linear with beam intensity, but the performance degrades with time due to beam damage of the microchannel plate.
    Type of Medium: Electronic Resource
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