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  • American Institute of Physics (AIP)  (4)
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  • 1
    Electronic Resource
    Electronic Resource
    Pulsed magnetic field-electron cyclotron resonance ion source operation : Proceedings of the 6th international conference on ion sources (1996)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 67 (1996), S. 1331-1333 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: The pulsed magnetic field (PuMa)-electron cyclotron resonance (ECR) ion source uses a pulsed coil to improve the peak current by opening the magnetic bottle along the beam axis. After demonstration of the principle of the pulsed magnetic extraction, the ion source was tested with different gases. We received promising results from helium to krypton. The influence of the current in the pulsed coil on the analyzed ion current was measured. With increased current levels within the pulsed coil not only the pulse height of the PuMa pulse, but the pulse length can also be controlled. By using the pulsed coil the maximum of the charge state distribution can be shifted to higher charge states. © 1996 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1146710
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  • 2
    Electronic Resource
    Electronic Resource
    Status of the pulsed magnetic field electron cyclotron resonance ion source : Proceedings of 5th international conference on ion sources (1994)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 65 (1994), S. 1078-1080 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: Synchrotrons like the heavy-ion synchrotron SIS at GSI need an efficient low duty cycle injector (typical 1-pulse/s and 200-μs pulse length). To improve the peak current, an electron cyclotron resonance (ECR) ion source has been designed using a pulsed magnetic field (PuMa) to force ion extraction. We replaced the hexapole of a 10-GHz Minimafios ECR ion source by a vacuum chamber containing a water-cooled bilayered solenoid coil and a decapole permanent magnetic structure. A pulse line feeds the solenoid with a 250-μs pulse which increases the magnetic field in the minimum B region by 0.3 T. This process opens the magnetic bottle along the beam axis resulting in an extracted ion pulse. First tests of the PuMa ECR configuration in cw and pulsed operation are presented and analyzed.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1145068
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  • 3
    Electronic Resource
    Electronic Resource
    Development of a Bi+ high current source for heavy ion driven plasma generators : Papers from the Ninth International Conference on Ion Sources (2002)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 73 (2002), S. 1033-1035 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: The development of a high current bismuth ion source is motivated by heavy ion driven fusion (HIF) and is part of the conceptual design of a HIF-relevant Bi+ test injector with four beamlets, which could serve as a HIF driver front end element. Envisaged is the development of a 300 mA Bi+ injector that can deliver four parallel beams from a 500 kV platform with 75 mA per beam. The first prototype source is driven by an arc discharge and provides singly charged Bi ions with a fraction more than 92% of the total extracted current. At its perveance limit this source delivers current of 70 mA, with the corresponding voltage being 27.5 kV. The emittance of a 21 mA/18.2 keV beam was measured and it amounted to 0.27 π mm mrad (80%, normalized, 4 root mean square) provided by a seven hole extraction system. Based on these investigations a new ion source will be designed and tested that will deliver current of 75 mA at ion energies up to 65 keV. In order to fulfill the requirements of HIF the emittance has to be in the vicinity of 0.4 π mm mrad (normalized). In this article we give a brief description of the design of an advanced ion source. Based on experimental experience using the previous prototype source one major modification made is the construction of an external oven. The use of more than one filament to increase the source lifetime is also planned. © 2002 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1433171
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  • 4
    Electronic Resource
    Electronic Resource
    Design of nondestructive emittance measurement device for H− beams : Papers from the Ninth International Conference on Ion Sources (2002)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 73 (2002), S. 998-1000 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: For the diagnostics of high-brightness particle beams as necessary for the European Spallation Source, spallation neutron source IFMIF (D1+), and HIDIF (Bi1+) nondestructive methods have to be developed. Conventional beam diagnostics are established, but are mostly destructive methods and suffer from the power density deposited on surfaces like slits or pinhole plates and beam loss. For negative ions a nondestructive method based on photoneutralization can be used to determine the transverse phase space distribution with high time resolution and a large number of phase space points. The interaction of laser light and H− ions produces a small number of neutral atoms as well as detached electrons. The beam of charged particles is separated magnetically from the neutral beam and the distribution of neutral hydrogen is measured. Under the assumption that the influence of the dipole is small enough, the laser induced emittance measurement can be used, e.g., near the entrance of radio-frequency quadrupole. The basic concept for the laser driven emittance measurement device will be presented together with design considerations and preliminary simulations on ion beam transport. © 2002 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1431413
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