Electronic Resource
[S.l.]
:
American Institute of Physics (AIP)
Review of Scientific Instruments
56 (1985), S. 214-219
ISSN:
1089-7623
Source:
AIP Digital Archive
Topics:
Physics
,
Electrical Engineering, Measurement and Control Technology
Notes:
A small size double-focusing mass spectrometer employing the Mattauch–Herzog geometry is described. Although developed primarily for helium isotope analyses, the design is such that it can be modified for a wide range of problems. The maximum radius of curvature of ions in the magnetic analyzer is 9.53 cm. With reasonably wide slits 3He can be separated from the HD+H3 combination usually present as an impurity while making analyses of helium in a static mode. At xenon the overlap at adjacent mass numbers is less than 1/10 000. In static operation the sensitivity approaches that of some of the large high sensitivity instruments employing special ion sources. The response is linear over a large pressure range. Since a conventional electron bombardment ion source is employed, ionizing electron energies may be varied, eliminating doubly charged ions such as 40Ar2+ which may interfere with 20Ne analyses. Because of the compact and rugged construction as well as low power consumption, the design lends itself to portable use in field operations.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1138333
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