Electronic Resource
[S.l.]
:
American Institute of Physics (AIP)
Review of Scientific Instruments
61 (1990), S. 2581-2584
ISSN:
1089-7623
Source:
AIP Digital Archive
Topics:
Physics
,
Electrical Engineering, Measurement and Control Technology
Notes:
An algorithm for determining the necessary angular corrections to bring a selected direction in a crystal into alignment using a two-axis goniometer is presented. The procedure requires the measurement of the specimen-to-film distance, the x and y (or polar) coordinates of the reflection of interest, and the recording of the values of the rotation and oscillation axis settings used to make the back-reflection photograph. A solution in closed form may then be calculated and checked for feasibility, given the physical oscillation limits of the goniometer.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1141841
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