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  • American Institute of Physics (AIP)  (2)
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  • 1
    Electronic Resource
    Electronic Resource
    Spin-coherent transport in ferromagnetically contacted carbon nanotubes (2002)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 80 (2002), S. 3144-3146 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The spin-coherent quantum transport through multiwall carbon nanotubes contacted by ferromagnetic Co pads is investigated experimentally. At 4.2 K, the devices show a remarkable increase of the magnetoresistance (MR) ratio with decreasing junction bias, reaching a maximum MR ratio of 30% at a junction bias current of 1 nA. The experimental results suggest the transport to be dominated by spin-dependent tunneling processes at the Co/nanotube interfaces and governed by the local magnetization. We also observe an asymmetry of the magnetoresistance peak position and width which is attributed to a local exchange biasing in the electrode material. © 2002 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1471570
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  • 2
    Electronic Resource
    Electronic Resource
    Nanometer-scale lithography in thin carbon layers using electric field assisted scanning force microscopy (1997)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 82 (1997), S. 5255-5258 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Resist patterning by scanning probe microscopy is a promising method to create structures in the nanometer range beyond the resolution of conventional electron beam or photo lithography. In conventional resist processing one has to remove either the exposed or unexposed resist in a solvent by an additional step. In this article we demonstrate the possibility of directly writing nano-scaled patterns in a thin amorphous carbon layer, which can be used as an etching mask, by a scanning force microscope. Above a threshold voltage between tip and sample small trenches can be created, whereby the carbon is completely removed from the exposed areas. Evidence is given that the mechanism responsible for the trench formation is a local field-induced oxidation of the carbon layer underneath the tip. © 1997 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.366392
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