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  • 1
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    Quantification of the sensitivity range in neutron dark-field imaging (2015)
    American Institute of Physics (AIP)
    Details
    Publication Date: 2015-12-17
    Description: In neutron grating interferometry, the dark-field image visualizes the scattering properties of samples in the small-angle and ultra-small-angle scattering range. These angles correspond to correlation lengths from several hundred nanometers up to several tens of micrometers. In this article, we present an experimental study that demonstrates the potential of quantitative neutron dark-field imaging. The dark-field signal for scattering from different particle sizes and concentrations of mono-dispersive polystyrene particles in aqueous solution is compared to theoretical predictions and the good agreement between measurements and calculations underlines the quantitative nature of the measured values and reliability of the technique with neutrons.
    Print ISSN: 0034-6748
    Electronic ISSN: 1089-7623
    Topics: Electrical Engineering, Measurement and Control Technology , Physics
    Published by American Institute of Physics (AIP)
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  • 2
    Electronic Resource
    Electronic Resource
    Waveguiding epitaxial LiNbO3 layers deposited by radio frequency sputtering (1992)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 72 (1992), S. 1154-1159 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Thin films of LiNbO3 were rf sputter deposited onto a number of different substrates and were investigated with a variety of characterization methods. The morphology of the films was investigated by the scanning electron microscope and the crystal structure was determined by x-ray diffraction and small area electron diffraction. The composition was obtained from electron spectroscopy for chemical analysis and was confirmed by Rutherford backscattering. Some optical properties of the film were also investigated, for example, the refractive index which was determined from the coupling angles or the losses of the guided modes measured by scanning a fiber probe along the mode. These analyses showed that best layers can be obtained when depositing LiNbO3 layers with a thickness of approximately 200 nm on (001)-sapphire at a temperature of 500 °C and a deposition rate of 0.2–0.5 nm/min. Using these parameters, single crystalline epitaxial films can be deposited having stoichiometric composition and minimal surface roughness. It was also possible to excite waveguide modes in these films with losses less than 5 dB/cm.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.351793
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    Paper (German National Licenses)
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  • 3
    Electronic Resource
    Electronic Resource
    Sputter deposition of epitaxial waveguiding KNbO3 thin films (1992)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 61 (1992), S. 373-375 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Thin, stoichiometric KNbO3 layers were sputter deposited onto (100)-spinel and (100)-MgO substrates at a substrate temperature of 610 °C. The composition of the layers was determined by Rutherford backscattering (RBS) measurements. Potassium stoichiometry was maintained by an enrichment of the target with K2CO3. Furthermore, channeling experiments indicated good crystal quality with a χmin of 40%. The x-ray diffraction spectra showed single-crystalline tetragonal films. Waveguide modes with losses of only 1.1 dB/cm at λ=632.8 nm could be excited in the sputtered films. The nonlinear optical coefficient d31=5 pm/V was determined by the Maker-fringe technique using the 1.06 μm Nd:YAG laser fundamental wavelength (compared to d31=15 pm/V measured in orthorhombic single crystals).
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.107914
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  • 4
    Electronic Resource
    Electronic Resource
    Mode behavior and high resolution spectra of circularly-symmetric GaAs-AlGaAs air-post vertical cavity surface emitting lasers (1996)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 69 (1996), S. 722-724 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The mode behavior of symmetric air-post vertical cavity surface emitting lasers is investigated using a unique tandem triple-pass Fabry–Perot interferometer as well as standard characterization techniques. A series of high resolution spectra taken at various current levels demonstrates relaxation oscillations of the fundamental mode and the lifting of mode degeneracy by crystal birefringence and structural anisotropy. Near field images and L–I measurements identify the discontinuous jumps in mode number and polarization. © 1996 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.117870
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