Electronic Resource
[S.l.]
:
American Institute of Physics (AIP)
Review of Scientific Instruments
56 (1985), S. 2222-2227
ISSN:
1089-7623
Source:
AIP Digital Archive
Topics:
Physics
,
Electrical Engineering, Measurement and Control Technology
Notes:
A polarization modulation ellipsometer for measurements of the complex dielectric function of opaque and reflecting materials in the wavelength range 230–920 nm is presented. The instrument can be built at relatively moderate cost but offers reasonable accuracy. It is suitable for routine measurements in a general solid-state laboratory because of its easy handling and maintenance.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1138403
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