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  • American Institute of Physics (AIP)  (16)
  • 1
    Electronic Resource
    Electronic Resource
    Combined ultrahigh vacuum scanning tunneling microscope scanning electron microscope system (1996)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 67 (1996), S. 2269-2273 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: We describe a combined ultrahigh vacuum scanning tunneling microscope (STM)–scanning electron microscope (SEM) system, which allows to position the STM tip with respect to the sample within an area of 5 mm×5 mm under SEM control. While the SEM resolution is sufficient to clearly resolve sub-μm structures on the samples, the STM features atomic resolution on semiconductor surfaces. The combination of SEM and STM allows high-resolution studies on inhomogeneous samples in materials research as well as the use for micro- and nanoelectronic device characterization or device modification. The STM performance was checked by atomically resolved imaging of Si(111) (7×7) surfaces. The STM/SEM combination and its application in device characterization is demonstrated by the investigation of vertically grown resonant tunneling diodes on an AlAs/GaAs basis. Due to its performance the system has a high potential for high-resolution imaging in materials research, for novel device characterization and nanoscale structuring or modification of very small devices. © 1996 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1147045
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  • 2
    Electronic Resource
    Electronic Resource
    Fiber interferometer-based variable temperature scanning force microscope (1997)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 68 (1997), S. 1776-1778 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: A scanning force microscope designed for an operation at temperatures between 4.2 and 300 K is presented. The deflection of the microfabricated force sensing cantilever is detected via an optical fiber interferometer. For low temperature imaging the whole instrument is incorporated into a bath cryostat which is suitable for both liquid helium and liquid nitrogen cooling. The instrument is of highly symmetric design in order to avoid large inner misalignment of the interferometer due to thermal expansion/contraction during temperature changes. In addition to this thermally compensated design, the interferometer can be adjusted by piezo actuators in situ in three dimensions. © 1997 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1147992
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  • 3
    Electronic Resource
    Electronic Resource
    Improved microtips for scanning probe microscopy (1990)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 61 (1990), S. 2538-2541 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: Improved electrochemical techniques for the reproducible fabrication of sharp metallic tips are presented. Radii of curvature down to 10 nm make the tips particularly suitable for scanning tunneling microscopy (STM) and atomic force microscopy (AFM). Additionally, simple methods are developed for preparing AFM cantilevers. A new type of spherical probe suitable for long-range scanning force microscopy has been fabricated. The probes consist of nearly perfect spheres with adjustable radii between about 50 and several 100 nm deposited at the very tip of tiny probe holders. Both probe and probe holder may consist of any metal. First experimental investigations confirm that the spherical probes are particularly suitable for van der Waals and magnetic force microscopy.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1141911
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  • 4
    Electronic Resource
    Electronic Resource
    Spatial and angle distribution of internal stresses in nano- and microstructured chemical vapor deposited diamond as revealed by Brillouin spectroscopy (2000)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 87 (2000), S. 74-77 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The use of a new Brillouin spectroscopic technique evidences the existence of internal stresses in white plasma assisted chemical vapor deposited diamond and allows a first assessment concerning their magnitude. The evaluation of the internal stresses is based on the pressure coefficients related to the longitudinal and transverse elastic constants. © 2000 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.371828
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  • 5
    Electronic Resource
    Electronic Resource
    A variable-temperature ultrahigh vacuum scanning tunneling microscope (2001)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 72 (2001), S. 2613-2617 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: A variable-temperature ultrahigh vacuum (UHV) scanning tunneling microscope (STM) was designed and tested. Design details and initial results are presented. The STM is directly attached to the cold face of a continuous flow cryostat which is mounted into a two-chamber UHV system. A significant advantage of this system in comparison to many others is, that samples can be cooled down to base temperature of 6.5 K within very short times of below 2 h. This feature not only increases the potential sample throughput, it also allows to cycle the sample temperature within the regime below 20 K without losing track of given sample locations. The instrument was tested by imaging Au layers on graphite. The vertical stability at low temperature was found to be below 3 pm. Images recorded at 6.5 K show crystalline Au islands and the Au(111)22×(square root of)3 reconstruction with atomic resolution. Using a resistive heater, the sample temperature was adjusted between 6.5 and 20 K. After an equilibration time of 15 min, the displacement due to the temperature change remained below 150 nm. Scanning tunneling spectroscopy on Au(111) grains resolves the Au(111) surface state. © 2001 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1372165
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  • 6
    Electronic Resource
    Electronic Resource
    Magnetic force microscopy: Some remarks from the micromagnetic point of view (1988)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 64 (1988), S. 1561-1564 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The present communication focuses on a critical micromagnetic discussion of the promising analytical possibilities with regard to ferromagnetic fine structures offered by the recent invention of magnetic force microscopy. As a result, some limiting constraints for the analysis of soft and hard ferromagnetic media are derived which have to be taken into account for an interpretation of the experimental results.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.341836
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  • 7
    Electronic Resource
    Electronic Resource
    Néel-line motion along Bloch walls (1987)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 62 (1987), S. 4918-4920 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The motion of Néel lines along subdivided 180° Bloch walls has been investigated on iron whisker single crystals by indirect optical observation through the influence on Bitter patterns. The field-induced displacement of the lines is dominated by microscopic Barkhausen jumps, where the lines exhibit a striking flexibility along their longitudinal extent. Phenomena such as line fusion, line nucleation, and interactions with crystal defects have been investigated more closely.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.339001
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  • 8
    Electronic Resource
    Electronic Resource
    In situ observation of interactions between Bloch walls and local crystalline defects (1988)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 63 (1988), S. 167-171 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The influence of local crystalline defects upon the magnetization reversal process of single-crystalline iron whiskers has been investigated by direct observation of the domain configuration and by inductive magnetization measurements. As an essential result, the investigations bring to evidence that only weak interactions are obtained between the dislocations and 180° Bloch walls. On the other hand, a strong pinning efficiency to 90° Bloch walls is observed which is due to the stress field created by the perturbation.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.340484
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  • 9
    Electronic Resource
    Electronic Resource
    Periodicity and surface flux closure of multipolar 180° Bloch walls (1987)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 62 (1987), S. 621-626 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The recent calculation of the specific energy associated with Néel singularities in cubic crystals now permits an estimation of the periodicity and self-magnetostatic energy of multipolar 180° Bloch walls. Additionally, it is shown that the slight zigzagging of these walls in the near-surface region of a crystal causes a considerable reduction of the effective free surface charges by an extensive flux closure internal to the crystal
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.339790
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  • 10
    Electronic Resource
    Electronic Resource
    Observation of subdivided 180° Bloch wall configurations on iron whiskers (1986)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 59 (1986), S. 4123-4128 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Subdivided 180° Bloch walls have been observed on iron whiskers using an improved colloid technique. Under the influence of a magnetic field applied vertical to the surface of a specimen the magnetization reversal of the complex wall is governed by Néel line motion. The field-induced conversion exhibits a characteristic "remanence'' and "coercivity'' of the wall. During a longitudinal magnetization cycle of a whisker the actual wall configuration has a substantial influence on the magnetization curve. The coercivity of the specimen is closely correlated to the initial mobility of the Néel lines. Discontinuities in the Néel line motion are responsible for small Barkhausen jumps, especially in the low-field region. The irregular segmentation of the complex wall in the remanent state appears to be an essential source of the remanent whisker magnetization.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.336670
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