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  • 1
    Electronic Resource
    Electronic Resource
    An electrostatic analyzer for surface structure measurements by low-energy-ion-scattering (1995)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 66 (1995), S. 3273-3279 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: A cylindrical electrode electrostatic analyzer has been designed for surface structure measurements which has sufficient sensitivity that shadowing/blocking data can be obtained without significantly damaging the surface structure. A modification to the standard π/(square root of)2 design compensates for that part of the spread in the ion energies due to elastic scattering kinematics. The analyzer is small enough to fit inside a standard 25 cm diameter UHV chamber on a turntable, allowing angular distribution measurements over a wide range of scattering angles. An example of a shadowing/blocking angular scan of a clean Si(100) surface is shown. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1145493
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  • 2
    Electronic Resource
    Electronic Resource
    Pulsed laser deposition of liquid crystals (1997)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 71 (1997), S. 2752-2754 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Thin films of 4-cyano-4'-pentylbiphenyl (5CB) liquid crystal have been fabricated by pulsed laser deposition. The suitability of different lasers (ArF, KrF and CO2) has been investigated over a range of fluence using visible-UV and infrared absorption and optical microscopy to characterise the films. High performance liquid chromatography (HPLC) and matrix assisted laser desorption ionization mass spectroscopy (MALDI-MS) were used to assess the extent of decomposition of the films. The results suggest that the CO2 laser acts as a quasi-steady heat source, while for ArF laser irradiation severe photodecomposition is observed. However, use of the KrF laser allows the production of excellent quality submicron films, showing properties similar to the 5CB target with only slight photodecomposition. © 1997 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.120124
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