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  • American Institute of Physics (AIP)  (5)
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  • 1
    Electronic Resource
    Electronic Resource
    Multipactor electron discharge physics using an improved secondary emission model (1998)
    [S.l.] : American Institute of Physics (AIP)
    Physics of Plasmas 5 (1998), S. 1535-1540 
    Details
    ISSN: 1089-7674
    Source: AIP Digital Archive
    Topics: Physics
    Notes: This study details particle-in-cell simulations of the multipactor effect and discharges created using this effect. A detailed secondary emission model which accounts for the energy and impact angle dependence of yield is developed to simulate accurately the phenomenon. It is shown that a steady state multipactor can be built up from a very low density initial electron distribution and an oscillatory steady state can be achieved. Steady state is reached when the cavity detuning and space charge of the built-up beam balance the phase focusing. The results for a more accurate secondary electron distribution are compared with simpler analytic models and extended. It is shown that, while the energy spread of secondary electrons differs from the monoenergetic analytical model, the weighted average energy is the same. Resistive loading of the circuit due to multipacting electrons is presented. The behavior of the system with Q values of between 20 and 200 is discussed. © 1998 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.872811
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  • 2
    Electronic Resource
    Electronic Resource
    Similarity of stability characteristics of planar and coaxial crossed-field diodes (1996)
    [S.l.] : American Institute of Physics (AIP)
    Physics of Plasmas 3 (1996), S. 2766-2769 
    Details
    ISSN: 1089-7674
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Simulations of cylindrical crossed-field diodes for anode/cathode radius ratios of 2 and 5 indicate that the limiting current curve in the region B〈BH in coaxial diodes follows the planar theory and simulations very closely. Coaxial diodes also follow planar theory predicting transition to turbulence in the region B(approximately-greater-than)BH. Larger radius ratio (10, 20) diodes show somewhat larger limits. These results show little variation with respect to operating voltage or cathode radius. A possible explanation for this behavior is also examined. © 1996 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.871722
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  • 3
    Electronic Resource
    Electronic Resource
    Reduction of crossed-field diode transmitted current due to anode secondary emission (1998)
    [S.l.] : American Institute of Physics (AIP)
    Physics of Plasmas 5 (1998), S. 261-265 
    Details
    ISSN: 1089-7674
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The limiting current theory for planar crossed-field diodes has long been studied extensively for various emission energies and temperatures. However, experimental measurements of transmitted current have shown significant departure from theory. This paper attempts to explain the reduction in transmitted current from that expected in theory in terms of secondary electron emission created by electrons hitting the anode. It is proposed that the presence of the secondary electrons increases the charge density in the gap, thereby reducing the amount of current transmitted. A detailed secondary emission model is implemented in a particle-in-cell code to study current reduction. The effect of secondary electrons on charge density, and on the resultant electric field and potential is also presented. © 1998 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.872696
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  • 4
    Electronic Resource
    Electronic Resource
    Modeling the electromagnetic excitation of a compact ECR ion/free radical sourcea) (1994)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 65 (1994), S. 1761-1765 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: The electromagnetic excitation of a discharge inside a microwave plasma source has been numerically modeled in the time domain. The source is a cylindrical, single-mode microwave-excited cavity. The time-varying electromagnetic fields inside the resonant cavity, both inside and outside the discharge region, are obtained by applying a finite-difference time-domain method to solve Maxwell's equations. The electromagnetic properties of the discharge load are described using a conductivity model. The spatial electric field patterns, natural frequencies, stored energy, and quality factor of a plasma-loaded, microwave-resonant cavity are simulated. Additionally, the simulated results for a simplified plasma source structure are compared to a known analytical solution to verify the simulation technique.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1144874
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  • 5
    Electronic Resource
    Electronic Resource
    Modeling the electromagnetic excitation of a compact ECR ion/free radical source (abstract)a) : Proceedings of 5th international conference on ion sources (1994)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 65 (1994), S. 1312-1312 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: The electromagnetic excitation of a discharge inside a microwave plasma source has been numerically modeled in the time domain. The source is a cylindrical, single-mode microwave-excited cavity. The time-varying electromagnetic fields inside the resonant cavity, both inside and outside the discharge region, are obtained by applying a finite-difference time-domain method to solve Maxwell's equations. The electromagnetic properties of the discharge load are described using a conductivity model. The spatial electric field patterns, natural frequencies, stored energy, and quality factor of a plasma-loaded, microwave-resonant cavity are simulated. Additionally, the simulated results for a simplified plasma source structure are compared to a known analytical solution to verify the simulation technique.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1144993
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