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  • American Institute of Physics (AIP)  (4)
  • 1
    Electronic Resource
    Electronic Resource
    Superconductor-normal metal-superconductor Josephson junctions with Ti interlayer (1998)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 73 (1998), S. 1583-1585 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Single nonhysteretic superconductor-metal-superconductor Josephson junctions consisting of Nb-Ti-Nb were prepared using the well-known anodization process for the isolation of the junctions. The 4×4 μm2 junctions show overdamped Josephson current-voltage characteristics at 4.2 K. The characteristic voltage IcRn is about 8.0 μV at a critical current density jc of about 29 kA/cm2. Under the influence of 10.5 GHz microwave irradiation the constant-voltage steps of n=0 and ±1 are observed with current amplitudes of about 3 mA. © 1998 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.122211
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  • 2
    Electronic Resource
    Electronic Resource
    Vertical inhomogeneity of the magnetization reversal in antiferromagnetically coupled Co/Cu multilayers at the first maximum : The 6th joint magnetism and magnetic materials (MMM)-intermag conference (1994)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 76 (1994), S. 6510-6512 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Magnetization behavior in antiferromagnetically (AFM) coupled multilayer systems was calculated by using an atomic layer model. Comparisons with the experimental results obtained on sputtered Co/Cu multilayers reveal remarkable differences in the magnetization reversal and in the field dependence of the magnetoresistance. Kerr loops measured from both sides of the stack display strong vertical differences. At the lower side near the Fe seed layer the magnetization reversal is in good agreement with that of our calculations whereas near the surface in large portions of the stack the AFM coupling is destroyed or varied. These effects are presumably caused by magnetic short circuits at defects in the multilayer structure. Cross-section transmission electron microscopy reveals growth defects which seem to be responsible for the deviations from the calculated ideal behavior.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.358245
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  • 3
    Electronic Resource
    Electronic Resource
    Radio-frequency based monitoring of small supercurrents (2001)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 72 (2001), S. 1882-1887 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: We consider the applicability of the established rf readout technique, which allows to obtain the supercurrent-phase relation of a Josephson element from impedance measurements in the phase-biased regime. In experiments on Nb-based single and double tunnel junctions, we demonstrate that this method holds even if the Josephson coupling energy is smaller than the thermal energy. Compared with conventional current–voltage measurements, we evaluate the rf technique to be favorable in particular for investigations of small supercurrents in low-capacitance Josephson elements. © 2001 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1347374
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  • 4
    Electronic Resource
    Electronic Resource
    Coplanar strips for Josephson voltage standard circuits (2001)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 79 (2001), S. 1009-1011 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We present a microwave circuit for Josephson voltage standards. Here, the Josephson junctions are integrated in a microwave transmission line designed as coplanar strips (CPS). The new layout offers the possibility of achieving a higher scale of integration and to considerably simplify the fabrication technology. The characteristic impedance of the CPS is about 50 Ω, and this should be of interest for programmable Josephson voltage standard circuits with SNS or SINIS junctions. To demonstrate the function of the microwave circuit design, conventional 10 V Josephson voltage standard circuits with 17 000 Nb/AlOx/Nb junctions were prepared and tested. Stable Shapiro steps at the 10 V level were generated. Furthermore, arrays of 1400 SINIS junctions in this microwave layout exhibited first-order Shapiro steps. © 2001 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1394163
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