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Scanning tip microwave near-field microscope (1996)

Wei, T. ; Xiang, X.-D. ; Wallace-Freedman, W. G. ; [et al.]

Woodbury, NY : American Institute of Physics (AIP)

Applied Physics Letters 68 (1996), S. 3506-3508

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ISSN: 1077-3118

Source: AIP Digital Archive

Topics: Physics

Notes: A near-field microscope which operates in the rf/microwave frequency range is described. In this microscope, a scanning tunneling microscope (STM)-like tip rather than an aperture is used as a point-like evanescent field emitter. A spatial resolution of ∼5 μm (∼λ/100 000) is achieved in the current version. The design of the microscope as well as the principal factors which affect its performance are discussed. © 1996 American Institute of Physics.

Type of Medium: Electronic Resource

URL: http://dx.doi.org/10.1063/1.115773

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