ISSN:
1089-7623
Source:
AIP Digital Archive
Topics:
Physics
,
Electrical Engineering, Measurement and Control Technology
Notes:
A high-resolution fluorescence spectrometer using a Johann geometry in a backscattering arrangement was developed. The spectrometer, with a resolution of 0.3 eV at 6.5 keV, combined with an incident beam, with a resolution of 0.7 eV, form the basis of a high-resolution instrument for measuring x-ray absorption spectra. The advantages of the instrument are illustrated with the near-edge absorption spectrum of dysprosium nitrate.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1143112
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