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  • 1
    Electronic Resource
    Electronic Resource
    An image processing equipment for the inventory of micrometer sized shapes (1989)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 60 (1989), S. 1086-1091 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: We describe an image-processing equipment designed and built to meet the specific requirements of an astrophysical experiment, but having probably useful applications in other fields of science and technology. It locates and makes the inventory of specified micrometer-sized holes in thin metallic films. The data acquisition is made by a CCD camera looking at the film through an optical microscope. The information goes to a microcomputer through a special interface. The program and the electronics were designed for optimum acquisition speed, automatic operation, and minimum need for human intervention.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1140322
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  • 2
    Electronic Resource
    Electronic Resource
    Formation of paramagnetic defects in high-purity silica by high-energy ions (1988)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 63 (1988), S. 1399-1407 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We investigated the paramagnetic defects formed by high-energy ions in amorphous SiO2 using electron spin resonance. We show that the variation of paramagnetic defect densities with both the residual range and the atomic number of the ion is not simply correlated with the total energy deposited in the sample, which is the major controlling parameter for other types of irradiation (γ rays, electrons). This specificity of ion irradiation is most likely related to the high local density of deposited energy. The observed populations of paramagnetic defects constitute a small fraction of the formed defects. However, their characteristics can be related to results on ion track structure obtained by small-angle scattering and track etching methods.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.339971
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