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  • 1
    Publication Date: 2015-10-09
    Description: Using simultaneous magnetic force microscopy and transport measurements of a graphene spin valve, we correlate the non-local spin signal with the magnetization of the device electrodes. The imaged magnetization states corroborate the influence of each electrode within a one-dimensional spin transport model and provide evidence linking domain wall pinning to additional features in the transport signal.
    Print ISSN: 0003-6951
    Electronic ISSN: 1077-3118
    Topics: Physics
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  • 2
    Publication Date: 2014-12-10
    Description: Understanding the complex properties of electronic and spintronic devices at the micro- and nano-scale is a topic of intense current interest as it becomes increasingly important for scientific progress and technological applications. In operando characterization of such devices by scanning probe techniques is particularly well-suited for the microscopic study of these properties. We have developed a scanning probe microscope (SPM) which is capable of both standard force imaging (atomic, magnetic, electrostatic) and simultaneous electrical transport measurements. We utilize flexible and inexpensive FPGA (field-programmable gate array) hardware and a custom software framework developed in National Instrument's LabVIEW environment to perform the various aspects of microscope operation and device measurement. The FPGA-based approach enables sensitive, real-time cantilever frequency-shift detection. Using this system, we demonstrate electrostatic force microscopy of an electrically biased graphene field-effect transistor device. The combination of SPM and electrical transport also enables imaging of the transport response to a localized perturbation provided by the scanned cantilever tip. Facilitated by the broad presence of LabVIEW in the experimental sciences and the openness of our software solution, our system permits a wide variety of combined scanning and transport measurements by providing standardized interfaces and flexible access to all aspects of a measurement (input and output signals, and processed data). Our system also enables precise control of timing (synchronization of scanning and transport operations) and implementation of sophisticated feedback protocols, and thus should be broadly interesting and useful to practitioners in the field.
    Print ISSN: 0034-6748
    Electronic ISSN: 1089-7623
    Topics: Electrical Engineering, Measurement and Control Technology , Physics
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  • 3
    Electronic Resource
    Electronic Resource
    College Park, Md. : American Institute of Physics (AIP)
    The Journal of Chemical Physics 115 (2001), S. 1995-1999 
    ISSN: 1089-7690
    Source: AIP Digital Archive
    Topics: Physics , Chemistry and Pharmacology
    Notes: In this paper we present a new approach to calculate optical spectra, which for the first time uses a polarization dependent functional within current density functional theory (CDFT), which was proposed by Vignale and Kohn [Phys. Rev. Lett. 77, 2037 (1996)]. This polarization dependent functional includes exchange-correlation (xc) contributions in the effective macroscopic electric field. This functional is used to calculate the optical absorption spectrum of several common semiconductors. We achieved in all cases good agreement with experiment. © 2001 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 4
    Electronic Resource
    Electronic Resource
    College Park, Md. : American Institute of Physics (AIP)
    The Journal of Chemical Physics 105 (1996), S. 6147-6153 
    ISSN: 1089-7690
    Source: AIP Digital Archive
    Topics: Physics , Chemistry and Pharmacology
    Notes: The polarization dependence of the (2+1) and (3+1) resonance enhanced multiphoton ionization of OCS have been investigated in the 70 500–74 500 cm−1 energy region. This region contains a complex system of bands arising from the excitation of the 4p Rydberg states. The symmetry of most of the observed bands have been unambiguously determined based on the intensity changes of the two and three photon resonant spectra using both linearly and circularly polarized light. These results generally confirm the assignments suggested in a previous study. New bands have also been observed and some new assignments are proposed. The vibrational frequencies ν1, ν2, and ν3 of the Rydberg states in that energy region are determined. © 1996 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 5
    Electronic Resource
    Electronic Resource
    College Park, Md. : American Institute of Physics (AIP)
    The Journal of Chemical Physics 107 (1997), S. 8866-8873 
    ISSN: 1089-7690
    Source: AIP Digital Archive
    Topics: Physics , Chemistry and Pharmacology
    Notes: The (2Πg3/2,1/2)nf Rydberg states of CS2 are investigated by means of (3+1) resonance enhanced multiphoton ionization (REMPI) time-of-flight (TOF) spectroscopy. The excitation spectrum of jet-cooled carbon disulfide has been obtained in the 74 000–81 000 cm−1 energy region. From the CS2+ mass selected REMPI spectra, the nf Rydberg series have been clearly identified and they have been found converging to the two spin–orbit components of the CS2+ (X 2Πg) ground state corresponding to the n=4–11 members. Comparison of the CS2+, CS+, S+ mass selected REMPI spectra gave a better insight of the competition between dissociation and ionization processes. The use of linearly and circularly polarized laser light, selection rules and quantum defect considerations have led to a preliminary analysis of the measured nf complexes. © 1997 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 6
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 77 (1995), S. 3308-3314 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Atomic force microscopy used in the resonant mode is a powerful tool for measuring local surface properties: for example, the quantitative analysis of the electrical forces induced by the application of an electric field between a conductive microscope tip and a surface allows the determination of the tip/surface capacitance and the local surface work function. However, these quantitative analyses require knowledge of tip geometry. In this article, we show that the simple procedure of evaluating the tip curvature radius by fitting the variations of the electrostatic force with the tip-surface distance is not always adapted to the case where one of the tip-surface system elements is a semiconductor. However, particular experimental conditions are determined to overcome these difficulties. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 7
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 66 (1995), S. 2848-2852 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: In resonant atomic force microscopy (AFMR) the calibration of the tip–sample relative displacement remains a major problem. Commonly used PZT piezoceramics exhibit a nonlinear behavior response for large applied voltages. For low voltages applied to the piezoceramics (i.e., small corrugations), the calibration can be performed by measuring the height of known structures. For large displacements, the interferometric heterodyne detection used in the AFMR provides a relative tip–sample displacement up to 10 μm, without removing the piezo-tube from the microscope. From these measurements, it was established that the piezosensitivity is not a constant parameter. Its averaged value during an excursion depends linearly on the applied voltage. With this system, routine controls are very easy and an example is given of the displacement corrections related to the nonlinearity of the piezo-tube for the electrostatic interaction between the tip and a gold surface. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 8
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 86 (1999), S. 5245-5248 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: In this article we show that in the atomic force microscopy experiments performed on a metallic surface, there is always a long range electrostatic force in addition to the van der Waals forces. This capacitive force is due to the contact potential between the tip and the surface and exists even without external applied potential. We have calculated this capacitive force for a real geometry of the tip–sample system and compared it to the van der Waals force calculated for the same geometry. We conclude that the electrostatic force is always dominant for a tip–surface distance larger than half of the tip radius of curvature. © 1999 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 9
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: A GaAs/AlAs microcavity containing six InGaAs quantum wells was grown, and the sample was then etched via chemically-assisted ion-beam etching to form 50-μm-diam cylindrical mesas. The formation of native oxides, accomplished by baking the samples at 400 °C in the presence of a pressurized N2/H2O vapor line, lowered the refractive index of the AlAs layers to 1.5. The higher refractive index contrast more effectively confined the intracavity field, leading to well-resolved reflectivity dips with an exciton-polariton splitting of 6.72 nm=9.44 meV at room temperature. © 1996 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 10
    Publication Date: 2014-10-04
    Description: We compare the performance of four different instruments that measure the vertical component of motion of an inertial mass—an STS1 seismometer, an STS2 seismometer, a superconducting gravity meter, and an optical seismometer—operating inside the mine at the Black Forest Observatory near Schiltach in southwest Germany. Simultaneous, collocated operation of these sensors offers an opportunity to test the calibration, response, and performance of each instrument. We estimate noise floors from the tidal bands to 10 Hz. We note small nonlinearities in the suspension of the STS1, which are normally suppressed by analog signal processing and feedback or, in the optical version, by digital signal processing alone. The results demonstrate that the optical seismometer utilizing an STS1 suspension can provide observatory-quality data over a bandwidth from tidal frequencies to at least 10 Hz and over a large dynamic range.
    Print ISSN: 0037-1106
    Electronic ISSN: 1943-3573
    Topics: Geosciences , Physics
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