Electronic Resource
Woodbury, NY
:
American Institute of Physics (AIP)
Applied Physics Letters
74 (1999), S. 2963-2965
ISSN:
1077-3118
Source:
AIP Digital Archive
Topics:
Physics
Notes:
Variations of the work-function differences between tip and sample over distance have been investigated by a special procedure with a scanning tunneling microscope. This procedure allows the measurement of displacement current Ic dependencies on the voltage U. For a Pt tip on a Au surface and for a W tip on a Pt surface, work-function differences among 0, 2 and 0, 6 eV were found. They increase with increasing distance. From the slope of the Ic(U) characteristics in different distances, the diameter of the tip is estimated. © 1999 American Institute of Physics.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.123980
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