ISSN:
1089-7623
Source:
AIP Digital Archive
Topics:
Physics
,
Electrical Engineering, Measurement and Control Technology
Notes:
A novel x-ray diffractometer was installed at the Australian National Beamline Facility at the Photon Factory, Japan, in October 1993. One of the major capabilities of the instrument is high speed high resolution powder diffraction using imaging plate detectors. The diffractometer combines a two circle goniometer and a large cassette in which imaging plates can be loaded covering 320° of 2θ. The diffractometer is enclosed in a large vacuum chamber and can be operated in air, vacuum, or helium. Recently, powder data has been obtained from rutile (TiO2) and NBS Si 640b at wavelengths from 0.62 to 1.9 A(ring) using imaging plates, and has been used to characterize the performance of the instrument. The data has been refined using the Rietveld method and R values of under 2% obtained. The resolution of the system varies from a minimum of about 0.04° to around 0.25° at 2θ angles around 160°, which is the equal of most synchrotron based powder diffractometers, and only slightly worse than that obtained using an analyzer crystal and scintillation detector. Using the imaging plates, 160° of data is simultaneously acquired in an exposure of about 10 min, compared to conventional counter diffractometer scans which routinely exceed 10 hours. © 1995 American Institute of Physics.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1145972
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