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  • American Institute of Physics (AIP)  (1)
  • American Meteorological Society (AMS)
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    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 84 (1998), S. 3059-3065 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: A new technique for measuring the transient potential distribution of electrical discharge is proposed. The measuring system consists of a Bi4Ge3O12 Pockels crystal, an Ar ion laser, a beam expander, a streak camera and a charge-coupled device camera. The potential profile of the discharge along a linear path of 50 mm in length is measured in the range of 0∼±36 kV. The temporal and spatial resolutions of this system are estimated to reach 2 ns and 0.1 mm, respectively. The potential distribution of a surface discharge creeping on a dielectric material is measured to clarify its developing mechanism. The tip of the propagating surface discharge has a high potential close to an applied potential. The maximum value of electric fields of a negative surface streamer exceeds 16 kV/cm in the direction of the streamer propagation. © 1998 American Institute of Physics.
    Type of Medium: Electronic Resource
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