Electronic Resource
[S.l.]
:
American Institute of Physics (AIP)
Journal of Applied Physics
75 (1994), S. 1739-1747
ISSN:
1089-7550
Source:
AIP Digital Archive
Topics:
Physics
Notes:
Optical properties of SiO2/TiO2 and Al2O3/Pt superlattice films have been studied by infrared ellipsometry with emphasis on the reststrahlen bands of the silicon and aluminum oxides. The SiO2 and TiO2 thicknesses were 5.0 and 3.2 nm, respectively, while the Al2O3 and Pt layer thicknesses were 10.0 and 2.5 nm. The presence of TiO2 layers created a pronounced spectral feature just above the SiO2 LO frequency. The results were analyzed by means of transfer matrices. It was found that a superlattice film is capable of introducing sharp spectral features at wavelengths where the refractive index of the substrate is close to unity and the absorption coefficient is small. The validity of effective permittivity calculations is investigated for insulator/insulator and insulator/metal superlattices, and the influence of Berreman polaritons is discussed. We also address the question of how the strength of these polaritons may be suppressed in certain configurations.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.356364
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