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Surface roughening transition and critical layer thickness in strained-layer heteroepitaxy of EuTe on PbTe (111) (1994)

Springholz, G. ; Frank, N. ; Bauer, G.

Woodbury, NY : American Institute of Physics (AIP)

Applied Physics Letters 64 (1994), S. 2970-2972

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ISSN: 1077-3118

Source: AIP Digital Archive

Topics: Physics

Notes: Heteroepitaxial growth of 2% lattice-mismatched EuTe on PbTe (111) by molecular beam epitaxy is investigated in the two-dimensional layer-by-layer growth regime combining in situ reflection high-energy electron diffraction and scanning tunneling microscopy (STM). At the critical layer thickness a distinct surface roughening is observed. The quantitative analysis of STM images yields an increase of the root mean square roughness by a factor of 4 at this roughening transition. Strong evidence is presented that for the used growth conditions this roughening is not caused by strain induced coherent islanding but by misfit dislocations at the onset of strain relaxation.

Type of Medium: Electronic Resource

URL: http://dx.doi.org/10.1063/1.111374

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