Electronic Resource
[S.l.]
:
American Institute of Physics (AIP)
Review of Scientific Instruments
66 (1995), S. 3560-3562
ISSN:
1089-7623
Source:
AIP Digital Archive
Topics:
Physics
,
Electrical Engineering, Measurement and Control Technology
Notes:
A novel method yielding simultaneous information about location and orientation of the crystallites in a polycrystalline specimen has been developed and succesfully applied to the investigation of thin diamond films deposited on silicon. The experiment uses the parallel beam from a synchrotron radiation source and a microchannel plate as collimator in front of an image plate detector. Exposure times of only a few minutes could be realized. The spatial resolution was 0.375 mm but can easily be improved. © 1995 American Institute of Physics.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1145469
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