Electronic Resource
Woodbury, NY
:
American Institute of Physics (AIP)
Applied Physics Letters
67 (1995), S. 560-562
ISSN:
1077-3118
Source:
AIP Digital Archive
Topics:
Physics
Notes:
20 keV N+ ions have been implanted on 57Fe enriched Fe films and RF deposited on glass and NaCl substrates with various fluences up to 3.0×1016 N+/cm2. Conversion electron Mossbauer spectroscopy and transmission electron microscopy measurements performed at room temperature on the as-implanted samples reveal the presence of α-Fe, α′-martensite, and ε-Fe3−xN phases. α″-Fe16N2 is only detected after a subsequent annealing at 220 °C; α′-martensite with a low nitrogen content appears as the precursor of α″, The additional nitrogen content needed for this process is supplied by the ε phase. © 1995 American Institute of Physics.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.115169
Permalink
|
Location |
Call Number |
Expected |
Availability |
