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  • 1
    Electronic Resource
    Electronic Resource
    Fiber optic interferometry for precision measurement of the voltage and frequency dependence of the displacement of piezoelectric tubes (2001)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 72 (2001), S. 3100-3102 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: Piezoelectric tube scanners used in scanning microscopy show nonlinear displacements with applied voltage. We have used an optical fiber based interferometer to make precision measurements of these nonlinearities. We have made the measurement of the sensitivity coefficient (displacement/voltage) for a wide range of different scanning voltage ranges and scanning rates, and find that the sensitivity coefficient has nonlinearities of order 4% as a function of the applied voltage. A 3% frequency dependence of the sensitivity coefficient is also measured. A phenomenological model is used to characterize the frequency dependence on the basis of a single relaxation time constant. © 2001 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1378341
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  • 2
    Electronic Resource
    Electronic Resource
    Low-frequency ac measurement of the Seebeck coefficient (2001)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 72 (2001), S. 4201-4206 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: We have analyzed the sources of error in the measurement of the Seebeck coefficient and designed a low frequency ac method to reduce them. This method has high precision in a short time period compared to commonly used dc methods while it minimizes some major sources of error that other ac methods do not. Furthermore, the setup can be fit into a 3 mm diam × 7 mm Teflon pressure cell and has minimal side effects due to the heat conductance of the pressure medium. We have also proposed and tested several methods to calibrate the Seebeck coefficient of thermocouples under pressure. © 2001 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1406930
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  • 3
    Electronic Resource
    Electronic Resource
    Sb-doped SrTiO3 transparent semiconductor thin films (2001)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 78 (2001), S. 1676-1678 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Optically transparent Sb-doped SrTiO3 thin films with a transmittance higher than 95% in most of the visible region have been grown on SrTiO3 (001) substrate by pulsed laser deposition. The films behave as an n-type semiconductor between 10 K and room temperature. The carrier concentration and mobility of the films at room temperature are ∼5.8×1017 cm−3 and ∼6.4 cm2/V s, respectively. X-ray photoelectron spectroscopy measurement reveals that the delocalized electrons from the Sb dopants give rise to deep impurity levels within the band gap of the parent compound, which are responsible for the electrical conduction observed. The wide band gap and low density of states in the conduction band account for transparency of the films. © 2001 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1355992
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