Publikationsdatum:
2015-02-04
Beschreibung:
Author(s): D. Okuyama, K. Shibuya, R. Kumai, T. Suzuki, Y. Yamasaki, H. Nakao, Y. Murakami, M. Kawasaki, Y. Taguchi, Y. Tokura, and T. Arima A synchrotron x-ray diffraction study of metal-insulator transitions in W-doped VO 2 (V 1−x W x O 2 ) thin films has been carried out. The insulating phase for x≤0.07 exhibits cell-doubling with the V dimerization similar to bulk VO 2 , while the insulating phase for x≥0.11 does not. This result suggests tha... [Phys. Rev. B 91, 064101] Published Tue Feb 03, 2015
Schlagwort(e):
Structure, structural phase transitions, mechanical properties, defects
Print ISSN:
1098-0121
Digitale ISSN:
1095-3795
Thema:
Physik
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