Crystallography Journals Online : IUCR Backfile Archive 1948-2001
Using X-ray diffractometry and spectral measurements, the structure and properties of graded X-ray optical elements have been examined. Experimental and theoretical data on X-ray supermirrors, which were prepared by the magnetron sputtering technique using precise thickness control, are reported. Measurements on graded aperiodic Si1−xGex single crystals, which were grown by the Czochralski technique, are also presented. The lattice parameter of such a crystal changes almost linearly with increasing Ge concentration. The measurements indicate that Si1−xGex crystals with concentrations up to 7 at.% Ge can be grown with a quality comparable to that of pure Si crystals.
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