AIP Digital Archive
We have performed small- and large-angle x-ray scattering experiments on CdTe/MnTe superlattices. The Fresnel optical method and the distorted wave Born approximation were used to extract from small-angle measurements out-of-plane and in-plane information about the interfaces. Specular reflectivity shows that the interface roughness is quite high (about 7 Å) for all superlattices. The effective MnTe concentration, directly determined from the refractive index profile, is successfully used to simulate the structured nonspecular scattering, and to determine the lateral correlation length of the interface roughness (about 1500±750 Å). Moreover, it is shown that the layers are almost completely correlated over the sample thickness. The thickness fluctuations along the growth direction are estimated from the analysis of the large-angle (004) reflection, and the effective MnTe profile is also checked by dynamical simulation. It is shown that the small- and large-angle results are in good agreement. The MnTe profile width deduced from x-ray reflectivity is slightly overestimated due to the large integration area of this technique. An estimation of the local MnTe profile is given. © 2000 American Institute of Physics.
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