ISSN:
1434-601X
Source:
Springer Online Journal Archives 1860-2000
Topics:
Physics
Notes:
Abstract The depth distribution of characteristic X-ray production in copper by 12 to 30 keV electrons has been measured with a zink tracer. The results are examined in terms of characteristic distribution parameters which show a potential law energy dependence. Reduction of the depth data and the electron energies by means of electron range and excitation energy, respectively, allows comparison with experimental and theoretical results of other authors on various target-tracer-combinations. Although a general energy dependence is found for the majority of the reduced characteristic parameters the accuracy of the data is not satisfying. Some of the measured distributions obviously contain large systematical errors.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1007/BF01395733
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