Publication Date:
2019-07-13
Description:
The laser cell scanner was used to characterize a number of solar cells made in various materials. An electron beam-induced current (EBIC) study was performed using a stereoscan scanning electron microscope. Planar p-n junctions were analyzed. A theory for the EBIC based on the analytical solution of the ambipolar diffusion equation under the influence of electron beam excitation parameter z (which is related to beam penetration), the junction depth Z sub j, the beam current and the surface recombination, was formulated and tested. The effect of a grain boundary was studied.
Keywords:
ENERGY PRODUCTION AND CONVERSION
Type:
NASA-CR-162166
,
DOE/JPL-954902-79/4
,
QR-4
Format:
application/pdf
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