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  • 1
    Electronic Resource
    Electronic Resource
    Springer
    Cellular and molecular life sciences 32 (1976), S. 87-89 
    ISSN: 1420-9071
    Source: Springer Online Journal Archives 1860-2000
    Topics: Biology , Medicine
    Notes: Summary The ability of dog renal cortex slices to accumulate β-methyl-glucoside or glycine is enhanced by the flavonoid (+)-catechin at a concentration of 3.5 mM. This stimulatory effect is apparently due to a decreased rate of efflux of either substrate. On the other hand, the uptake of p-amino-hippuric acid and N1-methyl-nicotinamide is inhibited by (+)-catechin. The drug at the same concentration is without action on amino-acid transport by guineapig intestine in vitro.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    Springer
    Cellular and molecular life sciences 32 (1976), S. 62-64 
    ISSN: 1420-9071
    Source: Springer Online Journal Archives 1860-2000
    Topics: Biology , Medicine
    Notes: Summary The changes in short-circuit current occurring when one or both solutions bathing the intestine of rat or guinea-pig mounted in flux chambers were recorded. The results with the guinea-pig can be explained in terms of diffusion potentials arising from the ionic replacements, and an electrogenic sodium pump, sensitive to ouabain, in the contraluminal membrane of the cell. In the rat, the situation is more complicated, and the enterocyte probably possesses an electrogenic sodium pump in the brush-border membrane.
    Type of Medium: Electronic Resource
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  • 3
    Publication Date: 1976-01-01
    Print ISSN: 0014-4754
    Topics: Biology , Medicine
    Published by Springer
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  • 4
    Publication Date: 1976-01-01
    Print ISSN: 0014-4754
    Topics: Biology , Medicine
    Published by Springer
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  • 5
    Publication Date: 1978-02-01
    Print ISSN: 0034-6748
    Electronic ISSN: 1089-7623
    Topics: Electrical Engineering, Measurement and Control Technology , Physics
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  • 6
    Publication Date: 2016-06-07
    Description: A technique was developed for measuring surface charge distribution near interfaces without placing any measuring apparatus near the face of the samples. The results of measurements which were made on FEP Teflon and Kapton dielectrics, before and after are given flashover, with various types of interfaces. Also given are data showing mean time between flashovers for various configurations exposed to a variety of environmental conditions. Several charge transfer mechanisms are considered as a means by which stable charge distributions may be maintained near interfaces.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: NASA. Lewis Res. Center Proc. of the Spacecraft Charging-Technol. Conf.; p 503-717
    Format: application/pdf
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  • 7
    Publication Date: 2019-06-27
    Description: Dielectric surface-charge distributions near a metal-dielectric interface in vacuum depend upon secondary emission processes in the presence of normal and tangential components of electric field. From measured charge distributions created by exposing a specimen of fluorinated ethylene-propylene to monoenergetic electron fluxes, it has been possible to calculate potentials and fields on and near the dielectric surface. The effect of the normal electric field upon secondary emission is measured directly, and the effect of the tangential field is inferred from the charge-distribution data. The critical point (unity crossover) for secondary emission is shifted by the application of fields, so that it occurs at much higher primary energies than normally. Primary beams having energies up to 20 keV are used, and surface fields are as high as 20 kV/mm.
    Keywords: SPACECRAFT DESIGN, TESTING AND PERFORMANCE
    Type: IEEE Transactions on Electrical Insulation; EI-14; Feb. 197
    Format: text
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  • 8
    Publication Date: 2019-06-27
    Description: The emission of secondary electrons from dielectrics subject to numerous effects of electric field which are experimentally difficult to control is discussed. Measurements are reported using pulse techniques such that local fields do not build to significant levels, but measurements with fields present are also of interest. A specific series of measurements under controlled conditions are described and their implications in terms of fields, magnitude and angle, near the dielectric surface were examined. The measurements were made for a charged fluorinated-ethylene-propylene surface near a grounded aluminum half-round resting on the surface. The geometry produced a stable surface-charge gradient being controlled by a strongly enhanced secondary emission for which a model is constructed. Observations of surface flashovers under various conditions confirm the predictions of some scaling exercises.
    Keywords: SPACECRAFT DESIGN, TESTING AND PERFORMANCE
    Type: NASA. Lewis Res. Center Spacecraft Charging Technol., 1978; p 734-746
    Format: text
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  • 9
    Publication Date: 2019-06-27
    Description: Experimental methods of mapping the equipotential surfaces near some structure of interest rely on the detection of charged particles which have traversed the regions of interest and are detected remotely. One method is the measurement of ion energies for ions created at a point of interest and expelled from the region by the fields. The ion energy at the detector in eV corresponds to the potential where the ion was created. An ionizing beam forms the ions from background neutrals. The other method is to inject charged particles into the region of interest and to locate their exit points. A set of several trajectories becomes a data base for a systematic mapping technique. An iterative solution of a boundary value problem establishes concepts and limitations pertaining to the mapping problem.
    Keywords: SPACECRAFT DESIGN, TESTING AND PERFORMANCE
    Type: NASA. Lewis Res. Center Spacecraft Charging Technol., 1978; p 606-620
    Format: text
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  • 10
    Publication Date: 2019-06-27
    Description: Interfaces between dielectric films and grounded metallic boundaries were exposed, in vacuum, to monoenergic electron fluxes having energies up to 22 keV. Two principal concerns were the measuring of the charge distributions on dielectrics and the determining of causes of flashovers, events where dielectric surface charges abruptly transfer to the metallic structures. Surface charges are perturbed within 10 mm of interfaces. Perturbations are relatively small except within about 3 mm of the interface. The probability of flashover was found to be related to microscopic imperfections in the interfaces. As flashovers occur in an exposed metal substrate, points become burned into the dielectric along the slit. As these points develop, the probability of flashover increases greatly. An interface which is highly immune to flashover was formed by covering a dielectric film with a 1.5-mm-thick aperture plate which exposes the film through a machined opening.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: NASA-CR-155195
    Format: application/pdf
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