Electronic Resource
[S.l.]
:
International Union of Crystallography (IUCr)
Acta crystallographica
34 (1978), S. 484-489
ISSN:
1600-5724
Source:
Crystallography Journals Online : IUCR Backfile Archive 1948-2001
Topics:
Chemistry and Pharmacology
,
Geosciences
,
Physics
Notes:
A simple Bragg-spacing comparator is described which achieves a routine precision of 3 parts in 108 in lattice-spacing measurements. One conventional X-ray source and three detectors are required and measurements take only 10 min. The instrument is used to survey the lattice-parameter variations in silicon crystals manufactured by many different suppliers since 1965.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1107/S0567739478001047
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