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  • 1975-1979  (1)
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    Troubleshooting plated-wire memories (1979)
    In:  Other Sources
    Details
    Publication Date: 2019-06-28
    Description: Faults in plated wire memories are identified and located from outside of system by applying electrical impulses and analyzing their reflectance in technique of Time-Domain Reflectometry (TDR). Intermittent faults are easier to find because memory system is not disturbed by probing or disassembly.
    Keywords: MECHANICS
    Type: MFS-23903 , NASA Tech Briefs (ISSN 0145-319X); 4; 1; P. 100
    Format: text
    Location Call Number Expected Availability
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    NASA TECHNICAL REPORTS
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