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  • American Institute of Physics (AIP)  (3)
  • 1985-1989  (3)
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Publisher
Years
Year
  • 1
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 64 (1988), S. 2279-2285 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: KDP, KD*P, and LiNbO3, three nonlinear optical materials that have been difficult to coat, are treated with polymeric surface layers. These layers hermetically seal the hygroscopic crystal surfaces. Their optical properties, thermal compatibility, high-power laser damage behavior, abrasive resistance, and suitability for overcoating with traditional, dielectric antireflection multilayers are reported.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 54 (1989), S. 2395-2397 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Poly(γ-benzyl L-glutamate), partially transesterified with 1-dodecanol, and polysiloxane were employed to fabricate a right- and left-handed optical element, respectively. The wavelength of selective reflection was tuned via physical blending or annealing at a proper temperature. An optical notch filter comprising elements with each handedness showed an optical density of 2.0 within the rejection band and 73 to 83% transmission outside the band, suggesting liquid crystalline polymers as promising materials for the construction of environmentally robust optical notch filters.
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 66 (1989), S. 4230-4242 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: A direct reading thermal comparator has been used to measure the thermal conductivity of dielectric thin-film coatings. In the past, the thermal comparator has been used extensively to measure the thermal conductivity of bulk solids, liquids, and gases. The technique has been extended to thin-film materials by making experimental improvements and by the application of an analytical heat flow model. Our technique also allows an estimation of the thermal resistance of the film/substrate interface which is shown to depend on the method of film deposition. The thermal conductivity of most thin films was found to be several orders of magnitude lower than that of the material in bulk form. This difference is attributed to structural disorder of materials deposited in thin-film form. The experimentation to date has primarily centered on optical coating materials. These coatings, used to enhance the optical properties of components such as lenses and mirrors, are damaged by thermal loads applied in high-power laser applications. It has been widely postulated that there may be a correlation between the thermal conductivity and the damage threshold of these materials.
    Type of Medium: Electronic Resource
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