Electronic Resource
[S.l.]
:
American Institute of Physics (AIP)
Review of Scientific Instruments
63 (1992), S. 5311-5314
ISSN:
1089-7623
Source:
AIP Digital Archive
Topics:
Physics
,
Electrical Engineering, Measurement and Control Technology
Notes:
A simple method for estimating the collection efficiency of a nearly ideal optical system is described. Calculation of spatial response functions for the analysis and absolute calibration of optical emission data is emphasized. The simple geometric algorithm presented is several orders of magnitude faster than algorithms based on ray tracing. The method is applied to the case of a radially uniform cylindrical source between parallel plates and the results are in excellent agreement with ray tracing calculations.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1143445
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