Electronic Resource
[S.l.]
:
American Institute of Physics (AIP)
Journal of Applied Physics
76 (1994), S. 33-38
ISSN:
1089-7550
Source:
AIP Digital Archive
Topics:
Physics
Notes:
Force curve imaging spectroscopy involves acquiring a force–distance curve at each pixel of an atomic force microscope image. Processing of the resulting data yields images of sample hardness and tip-sample adhesion. These images resemble Z modulation images and the sum of forward and reverse friction images, respectively, and like them exhibit a number of potentially misleading contrast mechanisms. In particular, XY tip motion has a pronounced effect on hardness images and the meniscus force on adhesion images.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.357150
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