Electronic Resource
[S.l.]
:
American Institute of Physics (AIP)
Review of Scientific Instruments
65 (1994), S. 3505-3510
ISSN:
1089-7623
Source:
AIP Digital Archive
Topics:
Physics
,
Electrical Engineering, Measurement and Control Technology
Notes:
New methods based on the reflection pulse technique are developed to study material properties. Using them, Curie temperatures in magnetic and ferroelectric materials, transition temperature and penetration depth in superconductors and characteristics of semiconductors, and semiconductor devices are determined.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1144529
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