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  • 1
    Digitale Medien
    Digitale Medien
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 76 (1994), S. 7797-7804 
    ISSN: 1089-7550
    Quelle: AIP Digital Archive
    Thema: Physik
    Notizen: Local vibrational modes (LVM) of Si in substitutional sites have been observed by resonant Raman spectroscopy in highly doped (≥8×1018 cm−3) InxGa1−xAs layers, either relaxed or under strain, on [100] GaAs substrates. The peak frequency ωLVM of the Si on Ga site (SiGa) LVM in unstrained samples shifts to lower values with increasing In content. For x≤0.10 this shift is clearly higher than expected from a linear interpolation between the measured values in the binaries. The comparison between the SiGa peak frequency measured in both a full strained layer and a relaxed layer with similar composition provides a rough determination of the deformation potentials for the SiGaLVM in these layers: q/ω2LVM=−2.7±1 and p/ω2LVM=−2.5±1. As the In content becomes higher the width of the SiGa peak increases much more than that of the GaAs-like longitudinal optical-phonon peak, revealing the splitting due to the loss of local symmetry introduced by the In. New calibration factors for the Si-defect concentrations have been deduced, which allow estimation of the solubility limit for the Si incorporation in substitutional positions, which ranges from 2.3×1019 to 2.6×1019 cm−3 for the layers at the growth conditions used. The analysis of the integrated intensity of the LVM Raman peaks indicates that the degree of electrical compensation is clearly reduced for increasing In up to x≤0.05, due to both an increase of the solubility limit for Si in these layers and a saturation or slight reduction of the SiAs-related defect concentrations. This conclusion is also supported by Hall and plasmon measurements. © 1994 American Institute of Physics.
    Materialart: Digitale Medien
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  • 2
    ISSN: 1089-7550
    Quelle: AIP Digital Archive
    Thema: Physik
    Notizen: The use of room- and low-temperature photoluminescence (PL) spectroscopy for the assessment of n-type pseudomorphic AlGaAs/InGaAs/GaAs high-electron-mobility transistor structures is reported. We describe a method to determine the InAs mole fraction x, the channel layer thickness L, and the confined two-dimensional electron gas density (ns), based on the comparison between the PL transitions and the recombination energies derived from self-consistent calculations of the subband structure. A detailed analysis of the optical transitions and their dependence on the Fermi level position and temperature is performed. It is shown that, in real devices, the high sensitivity of the recombination energies and intensities on small changes of the parameters x, L, and ns allows us to detect deviations from their nominal structural parameters within the uncertainty of the molecular beam epitaxy growth technique. The present assessment procedure has been applied to a significant number of samples, and it has been backed by independent measurements of these parameters by more sophisticated techniques such as Shubnikov–de Haas and PL excitation in standard and gated samples, and by physical techniques like transmission electron microscopy and Auger spectroscopy.
    Materialart: Digitale Medien
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  • 3
    ISSN: 1089-7550
    Quelle: AIP Digital Archive
    Thema: Physik
    Notizen: By embedding piezoelectric InGaAs/GaAs multiple quantum wells (MQWs) in specifically designed p-i-n structures, we demonstrate that the nonlinear optical response can be used to identify the dominant screening mechanisms and simultaneously to determine the strain distribution. Furthermore, we show that a knowledge of the screening mechanisms and spatial band structure, in turn, can be used to control the nonlinear optical response. For this demonstration, we fabricate two p-i(MQW)-n samples on [111]-oriented GaAs substrates. The samples are designed such that, if the dominant screening is associated with photogenerated carriers that remain in the wells, a blue shift of the exciton would be expected in each. By contrast, if the screening is associated with carriers that have escaped the wells and moved to screen the entire MQW, one will shift to the blue and the other to the red if the lattice is mechanically clamped, but both will shift to the red if the lattice is mechanically free. The observation of a blue shift and a red shift indicates that, while in-well screening may be present, the dominant screening is out-of-well and that these particular structures are mechanically clamped to the lattice constant of the GaAs. Most importantly, these results illustrate the added flexibility that the piezoelectric field gives in tailoring the nonlinear optical response. © 1994 American Institute of Physics.
    Materialart: Digitale Medien
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  • 4
    Digitale Medien
    Digitale Medien
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 57 (1985), S. 5295-5301 
    ISSN: 1089-7550
    Quelle: AIP Digital Archive
    Thema: Physik
    Notizen: Transient capacitance and photocapacitance techniques have been used to study the characteristics of two electron traps related to Te in GaAs1−xPx: Te. Levels En1 and En2 have thermal activation energies of 0.17 and 0.27 eV, respectively, and their thermal electron emission and capture rates deviate markedly from Schockley–Read–Hall theory for near band gap crossover compositions. Such centers are found for 0.3〈x≤1, are linked to the X conduction band minima, and their photoionization thresholds are 0.5 and 1 eV, respectively. Trap concentrations have been studied as a function of Te doping level, Zn diffusion temperature, and N content (x〉0.4) in GaAsP LEDs. It is suggested that both defects belong to the DX type, and they have been described by a large lattice relaxation model. Franck–Condon energies of 0.3 and 0.95 eV have been determined, respectively. The properties of present Te-related defects are quite similar to donor related centers in AlxGa1−xAs, including the nonexponential capacitance transients found in near x∼0.4 compositions. It is important to mention that both centers have very large hole capture coefficients (σp〉10−14 cm2) and behave as efficient recombination centers.
    Materialart: Digitale Medien
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  • 5
    Digitale Medien
    Digitale Medien
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 72 (1992), S. 525-530 
    ISSN: 1089-7550
    Quelle: AIP Digital Archive
    Thema: Physik
    Notizen: Deep-level transient spectroscopy (DLTS) and constant-capacitance DLTS (CC-DLTS) techniques have been used to investigate selenium-related DX centers in AlGaAs alloys. The value of the thermal activation energy obtained by both techniques was the same (0.21 eV); however, experimental curves show some important differences. While CC-DLTS curves show only one peak, which reveals that there exists only one DX center in Se-doped AlGaAs, in DLTS curves it is possible to resolve up to two peaks lying at a lower temperature than the one observed by CC-DLTS. This disagreement may be due to the fact that DLTS measurements are strongly affected by refilling effects which occur in the edge zone of the space-charge region during capacitance transients performed at constant voltage. These effects accelerate the capacitance transients and can lead to too high thermal-emission rates. In contrast, these effects do not affect CC-DLTS curves, because in constant-capacitance voltage transients the edge of the space-charge region remains unchanged and refilling effects do not take place. These effects are rather important on DX levels because they exhibit thermally activated capture cross sections and very low ionization factors at the experimental temperatures and, therefore, capture processes are slow and their time constants can be similar to those of the emission processes.
    Materialart: Digitale Medien
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  • 6
    Digitale Medien
    Digitale Medien
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 73 (1993), S. 4988-4997 
    ISSN: 1089-7550
    Quelle: AIP Digital Archive
    Thema: Physik
    Notizen: The properties of deep donor states (DX centers) in III-V alloys are discussed in relation to their influence on device characteristics and performance. The techniques to avoid or minimize such deleterious effects in AlGaAs-based devices are discussed, along with their physical basis, and some guidelines for improved III-V device design are established. New results about the benefits of proper donor selection, the role of In alloying, the advantage of δ doping in layers and in modulation-doped devices, and the use of AlInAs and InGaP as alternative wide band-gap III-V alloys are presented.
    Materialart: Digitale Medien
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  • 7
    Digitale Medien
    Digitale Medien
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 58 (1991), S. 735-737 
    ISSN: 1077-3118
    Quelle: AIP Digital Archive
    Thema: Physik
    Notizen: The ionization processes of Se-related DX centers have been studied in AlGaAs Schottky diodes under high reverse bias conditions. A spectroscopy technique that provides directly the free-electron concentration has been used. Besides the well known thermal and optical electron emission processes, a new mechanism, attributed to an impact ionization process of DX centers, is described, and its kinetics is analyzed.
    Materialart: Digitale Medien
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  • 8
    Digitale Medien
    Digitale Medien
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 59 (1986), S. 2235-2243 
    ISSN: 1089-7550
    Quelle: AIP Digital Archive
    Thema: Physik
    Notizen: In AlGaAs red light-emitting diodes fabricated by liquid-phase epitaxy the presence and characteristics of deep centers located near the injecting-active junction boundaries have been studied. Transient capacitance, DLTS, photocapacitance, and photocurrent techniques have been applied. Besides the presence, in the n-type injecting layer, of centers related to the Te dopant (DX defects), deep hole traps have been detected at both sides of the n-p heterojunction. The physical origin of such hole traps, present in moderately large concentrations, is discussed in terms of Zn-related complexes. This defect pattern allows us to explain the thermal- and photocapacitance, and the freeze-out and photocurrent characteristics found in such devices.
    Materialart: Digitale Medien
    Standort Signatur Erwartet Verfügbarkeit
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  • 9
    Digitale Medien
    Digitale Medien
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 52 (1988), S. 660-661 
    ISSN: 1077-3118
    Quelle: AIP Digital Archive
    Thema: Physik
    Notizen: Deep-center characterization by deep-level transient spectroscopy (DLTS) allows a direct determination of the trap thermal emission activation energy. However, capture barrier energy measurements, based on trap partial filling by pulses of increasing width, require a quite different experimental processing and pose some hardware difficulties. In this letter we present a new method to determine the trap capture barrier energy, one that requires constant-width filling pulses and obtains capture information from standard DLTS data. This technique has been applied to Te-, Sn-, and Si-related DX centers in AlGaAs alloys.
    Materialart: Digitale Medien
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  • 10
    Digitale Medien
    Digitale Medien
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 52 (1988), S. 383-385 
    ISSN: 1077-3118
    Quelle: AIP Digital Archive
    Thema: Physik
    Notizen: Hydrostatic pressure techniques together with deep level transient spectroscopy (DLTS) measurements have shown that the Si-DX center in GaAlAs is linked to the L-conduction-band minimum. When hydrostatic pressure is applied to a 74% Al content sample, an exponential reduction of the DLTS signal is observed. This exponential dependence with pressure arises from the reduction of the DX filling factor (electron occupancy) due to the increasing X-L energy difference with pressure. Our results, together with previous data, also show that the capture barrier height originating from the lattice relaxation is an intrinsic parameter of both the material and the donor species, that does not depend on Al content or conduction-band structure.
    Materialart: Digitale Medien
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