ISSN:
1572-9486
Source:
Springer Online Journal Archives 1860-2000
Topics:
Physics
Notes:
Abstract Magnetic force microscopy (MFM) can be used to image current distributions in current leads of sub-micron dimensions. Here we present a systematic study about the spatial and force resolution of such currents. In the case of force resolution, we studied the least measurable magnetic force of MFM for different sample currents. The analysis of images from parallel Al conducting plates are combined with those from force-distance curves and finite element calculations. Several interacting regimes between the magnetic tip and the currents are found and interpreted. It is shown that model calculations are necessary even for qualitative image interpretation. Then spatial resolution in the range of 100 nm can well be obtained and quantitative studies of current distributions on widths of 10 nm resolution are possible in special cases. The approach is demonstrated in imaging the current distribution in superconducting Bi2Sr2CaCu2O x single crystals.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1023/A:1022867731052
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