Electronic Resource
Copenhagen
:
International Union of Crystallography (IUCr)
Applied crystallography online
34 (2001), S. 13-15
ISSN:
1600-5767
Source:
Crystallography Journals Online : IUCR Backfile Archive 1948-2001
Topics:
Geosciences
,
Physics
Notes:
The influence of the instrumental resolution on two-dimensional reflection profiles of epitaxic YBa2Cu3O7−δ films on SrTiO3 (001) has been studied in order to investigate the strain in the superconducting films. The X-ray diffraction intensity data were obtained by two-dimensional scans in reciprocal space (q-scan). Since the reflection broadening caused by the apparatus differs for each position in reciprocal space, a highly crystalline substrate was used as a standard. Thus it was possible to measure a standard very close to the YBa2Cu3O7−δ reflections in reciprocal space. The two-dimensional deconvolution of reflections by a new computer program revealed an anisotropic strain of the two twinning systems of the film.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1107/S002188980001445X
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