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  • 2000-2004  (1)
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    ISSN: 1572-9788
    Keywords: late blight ; Phytophthora infestans ; potato ; resistance,Solanum berthaultii ; Solanum tuberosum
    Source: Springer Online Journal Archives 1860-2000
    Topics: Agriculture, Forestry, Horticulture, Fishery, Domestic Science, Nutrition
    Notes: Abstract Under controlled field conditions, a Solanum backcross population segregated for resistance to Phytophthora infestans. The population (`BCT') had been derived previously by crossing the Solanum tuberosum dihaploid USW2230 × Solanum berthaultii PI473331 to obtain the hybrid M200-30, and then backcrossing the hybrid to the S. tuberosum dihaploid HH1-9. Resistance was assessed from analyses of epidemics in small plots of each individual genotype, and data were recorded as area under the disease progress curve (AUDPC). The parents of the original cross (USW2230 and a selection from PI473331) were not included in the test, but the hybrid was incompatible and HH1-9 was compatible with the tester strain of P. infestans (US-8 lineage). Somewhat more than half of the progeny also were incompatible with the tester strain, indicating the presence of an R gene. This gene segregated from the S. berthaultii parent and mapped 4.8 cm from the RFLP marker TG63 on chromosome 10. We deduce that the R gene is not R-1, R-2, R-3, R-6, or R-7 and is probably not R-4, R-5, or R-10. Among the remaining, compatible progeny, there was a wide range of quantitative resistance. All were more resistant than the susceptible cultivar Superior, and most individuals were much more resistant than the moderately resistant cultivar Kennebec. AUDPC values among the sub-population of compatible genotypes ranged from about 400 to 1500 units the first year and from 400 to 1760 units the second year. At least five quantitative trait loci (QTLs) were detected in this sub-population in both 1997 and 1998, including one detected through segregation of alleles from both the hybrid parent and the recurrent S. tuberosum parent. A model of main and epistatic effects explained 56% and 66% of the variation observed for quantitative resistance to late blight in 1997 and 1998, respectively. Several of the QTLs for late blight resistance were located in regions of the genome to which QTLs for late maturity have previously been mapped.
    Type of Medium: Electronic Resource
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